Single-Compound Complementary Split-Ring Resonator for Simultaneously Measuring the Permittivity and Thickness of Dual-Layer Dielectric Materials

Lee, Chieh-Sen; Yang, Chin‐Ping

doi:10.1109/tmtt.2015.2418768

Cited by 59 publications

(21 citation statements)

References 35 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The ability of microwave signals to penetrate dielectric materials and interact with their inner structure makes microwave techniques attractive candidates for under insulation inspection. Several microwaves and millimeterwave NDT techniques have been reported for delamination and thickness measurement [15][16][17][18][19][20]. In [15], a millimeterwave active radiometer system is used to detect and measure the delamination in Glass Fiber Reinforced Polymer (GFRP) composite material using transmission mode measurement.…”

Section: Introductionmentioning

confidence: 99%

“…In [16] and [17], electromagnetic inspection using couple spiral inductors based on the magnitude of the transmission coefficient, 21 , is presented to image the defects in Carbon Fiber Reinforced Polymer (CFRP) composite materials. Chieh-Sen Lee et al [18][19][20] have used resonant near-field probes to measure the variation of a multi-layered dielectric structure in the form of permittivity or thickness based on the shift in the resonant frequency. However, these low frequency near-field spiral sensors and resonators have poor spatial resolution since the resonant frequency of these probes is dependent on the effective relative permittivity of the coating, and it is highly influenced by the porosity and surface irregularity of the coating.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Nondestructive Evaluation of Coatings Delamination Using Microwave Time Domain Reflectometry Technique

et al. 2020

View full text Add to dashboard Cite

Ceramic based coatings such as Thermal Barrier Coatings (TBCs) are widely deposited onto gas turbine engine components to protect their metal substrate against high temperature. However, improper adhesive application, thermal stress and moisture penetration through the insulation materials can cause defects such as delamination to grow between the insulation and the metal surface. Such defects could lead to catastrophic failure if not immediately detected and repaired. Hence, it is imperative to non-destructively inspect these interfaces for delamination to avoid such an event. In this paper, a novel microwave nondestructive testing technique for ceramic-based coatings is proposed. This technique is based on scanning the surface of the coating with an open-ended rectangular waveguide and analyzing the reflections in the time domain. The proposed time-domain technique appears to reveal more about the depth of any existing delamination than any other microwave non-destructive testing (NDT) technique. Here, a ceramic sample with machined delamination is scanned using rectangular waveguides operating from 26.5 to 40 GHz. After applying Fourier analysis to the frequency domain waveguide reflections, time-domain results showed the delamination with significantly better depth resolution compared to frequency domain analysis. The results reported in this paper prove the advantages of the time-domain technique to forecast the relative delamination depth, which is important for many industrial applications. The depth information of delamination can be used in a condition-based predictive maintenance schedule to plan the inspection intervals efficiently, minimize the unnecessary replacements and provide practical guidance for future design.

show abstract

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Nondestructive Evaluation of Coatings Delamination Using Microwave Time Domain Reflectometry Technique

et al. 2020

View full text Add to dashboard Cite

show abstract

“…Two parameters are important for sensitivity comparison, the first being the shift in resonance frequency of the sensor due to interaction with MUT with respect to the free space resonance frequency, and second being the relative permittivity of MUT. The sensitivity of various state of art sensors [49][50][51][52][53][54] based on the resonance frequency shift is tabulated in Table 1. If two sensors are loaded with identical MUTs then the sensor with high resonance frequency will give higher shift in resonance frequency.…”

Section: Introductionmentioning

confidence: 99%

Extremely Sensitive Microwave Sensor for Evaluation of Dielectric Characteristics of Low-Permittivity Materials

Haq

Ruan

Zhang

et al. 2020

Sensors

View full text Add to dashboard Cite

In this paper, an extremely sensitive microwave sensor is designed based on a complementary symmetric S shaped resonator (CSSSR) to evaluate dielectric characteristics of low-permittivity material. CSSSR is an artificial structure with strong and enhanced electromagnetic fields, which provides high sensitivity and a new degree of freedom in sensing. Electromagnetic simulation elucidates the effect of real relative permittivity, real relative permeability, dielectric and magnetic loss tangents of the material under test (MUT) on the resonance frequency and notch depth of the sensor. Experiments are performed at room temperature using low-permittivity materials to verify the concept. The proposed design provides differential sensitivity between 102% to 95% as the relative permittivity of MUT varies from 2.1 to 3. The percentage error between simulated and measured results is less than 0.5%. The transcendental equation has been established by measuring the change in the resonance frequency of the fabricated sensor due to interaction with the MUT.

show abstract

“…Later on band-pass and band-stop characteristics are used for sensing based on variation in resonance frequency due to interaction with the MUTs. Currently reported complementary metamaterial based microwave sensors are operating at a single [24]- [27], dual [28], [29], tri [30], and tetra [31] frequency bands.…”

Section: Introductionmentioning

confidence: 99%

“…In [27], a circular C-SRR is used to design a single notch sensor with an operating frequency between 1.7 GHz to 2.7 GHz for material characterization. In [28], single compound C-SRR is used to design a dual notch sensor with the operating frequency between 1 GHz to 5 GHz for measuring permittivity and thickness of dual layer substrate. In [29], a pair of C-SRR is used for differential sensing between 1 GHz to 3 GHz for dielectric materials but limited for the qualitative measurements.…”

Section: Introductionmentioning

confidence: 99%

Dual Notch Microwave Sensors Based on Complementary Metamaterial Resonators

et al. 2019

View full text Add to dashboard Cite

In this paper, three dual notch microwave sensors are presented based on a microstrip transmission line and complementary metamaterial resonators. The main aim of this paper is to compare the constitutive parameters and sensitivity of all three dual notch sensors which are based on complementary symmetric split ring resonator (CS-SRR), complementary asymmetric split ring resonator (CAS-SRR) and complementary bisymmetric split ring resonator (CBS-SRR). The main motivation beyond the presented work is to use dual notches to estimate the relative permittivity of material under test (MUT). Electromagnetic simulation elucidates the origin of dual mode resonance of all the three resonators. Sensitivity analysis is performed on each sensor by using fifteen MUTs with relative permittivity ranges from 1.006 to 16.5 and constant dimensions 10 mm × 10 mm × 1 mm. To verify the concept, a sensor is fabricated and its response is measured using a vector network analyzer (AV3672). Using curve fitting technique the shift in the resonance frequencies of the fabricated sensor due to interaction with MUT is presented as a function of permittivity. Simulated, measured and formulated results are in good agreement with each other.

show abstract

Single-Compound Complementary Split-Ring Resonator for Simultaneously Measuring the Permittivity and Thickness of Dual-Layer Dielectric Materials

Cited by 59 publications

References 35 publications

Nondestructive Evaluation of Coatings Delamination Using Microwave Time Domain Reflectometry Technique

Nondestructive Evaluation of Coatings Delamination Using Microwave Time Domain Reflectometry Technique

Extremely Sensitive Microwave Sensor for Evaluation of Dielectric Characteristics of Low-Permittivity Materials

Dual Notch Microwave Sensors Based on Complementary Metamaterial Resonators

Contact Info

Product

Resources

About