2013
DOI: 10.1117/12.2017058
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Single and multi-channel Al-based multilayer systems for space applications in EUV range

Abstract: We report on further development of reflective multilayer coatings containing aluminum as low absorbing material for the extreme ultra-violet (EUV) applications, in particular for solar physics. Optimizations of the multilayer design and deposition process have allowed us to produce Al-based multilayers having relatively low interface roughness and record EUV reflectances in the range from 17 to 40 nm. The peak reflectance values of 56 % at 17.5 nm, 50 % at around 21 nm, and 42 % at 32 nm were achieved with ne… Show more

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Cited by 13 publications
(8 citation statements)
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References 24 publications
(28 reference statements)
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“…It turns out that 8026 reached 31.9% reflectance at 19.1 nm (-2.2% absolute), 8028 reached 27.6% at 39.7 nm (-0.8%) and 8031 showed a reflectance of 16.6% at 42.4 nm (-1.0%). These changes are in the typical range of EUV coating evolution in the first year after deposition [16] and may be explained by a modification of the top layer (oxidization and/or contamination) [17]. These results demonstrate adequate temporal stability of the EUV performance of Al/Sc multilayers protected with a 3 nm thick SiC capping layer.…”
Section: Reflectance Measurements In the Euv For Al/sc Multilayersmentioning
confidence: 58%
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“…It turns out that 8026 reached 31.9% reflectance at 19.1 nm (-2.2% absolute), 8028 reached 27.6% at 39.7 nm (-0.8%) and 8031 showed a reflectance of 16.6% at 42.4 nm (-1.0%). These changes are in the typical range of EUV coating evolution in the first year after deposition [16] and may be explained by a modification of the top layer (oxidization and/or contamination) [17]. These results demonstrate adequate temporal stability of the EUV performance of Al/Sc multilayers protected with a 3 nm thick SiC capping layer.…”
Section: Reflectance Measurements In the Euv For Al/sc Multilayersmentioning
confidence: 58%
“…We protected all the "thickness study" samples with a 3 nm thick SiC top layer. We have previously demonstrated that such SiC capping layers are able to assure a good temporal stability of Al-based multilayers [16,17]. For the optimized samples, we adjusted the SiC top layer thickness in order to reach the highest reflectance (see Table 1).…”
Section: Fabrication and Characterization Techniquesmentioning
confidence: 99%
“…The best results in terms of the EUV reflectance and long-term stability were obtained both with Al/Mo/SiC 97 and Al/Mo/B 4 C structures: the reflectance peaks of about 56% at 17.4 nm and about 50% at 21 nm were demonstrated to be stable over four years. 95 Furthermore, Al/Mo/B 4 C reached a reflectance of 42% at 32 nm. 95 Such coatings showed a fair drop in reflectance after annealing of nearly 6 sweeks at 100 C in air atmosphere, probably due to surface oxidation; 95 in contrast, they remained stable after many vacuum thermal cycles ranging from −50 C up to +70 C. 96 In Figure 7 the peak reflectance expected with Al/Mo/B 4 C at each wavelength is reported and compared with the experimental results available in Ref.…”
Section: Al-based Euv ML Structuresmentioning
confidence: 96%
“…95 Furthermore, Al/Mo/B 4 C reached a reflectance of 42% at 32 nm. 95 Such coatings showed a fair drop in reflectance after annealing of nearly 6 sweeks at 100 C in air atmosphere, probably due to surface oxidation; 95 in contrast, they remained stable after many vacuum thermal cycles ranging from −50 C up to +70 C. 96 In Figure 7 the peak reflectance expected with Al/Mo/B 4 C at each wavelength is reported and compared with the experimental results available in Ref. [95].…”
Section: Al-based Euv ML Structuresmentioning
confidence: 96%
“…However, the influence of the SiO2 top layer on the reflectance spectra out of the Bragg peak region is negligible. 1) have been developed simultaneously with Al/Mo/SiC and provide high efficiencies with near normal incidence reflectance up to 50% at 21 nm 13 (not shown in this paper) and 42% at 30 nm for an incidence angle θ = 80° (Figure 5).…”
Section: Al/mo/sic Multilayer Mirrorthree-component Structurementioning
confidence: 99%