2008
DOI: 10.1016/j.optcom.2007.05.071
|View full text |Cite
|
Sign up to set email alerts
|

Simultaneous spatial and temporal focusing in nonlinear microscopy

Abstract: SIMULTANEOUS SPATIAL AND TEMPORAL FOCUSING IN NONLINEAR MICROSCOPYMichael Earle Durst, Ph. D. Cornell University 2009Multiphoton microscopy (MPM) has become a powerful tool for imaging biological samples due to its ability to perform optical sectioning. MPM yields many advantages over standard one-photon imaging: a deeper penetration depth due to longer wavelength excitation, confinement of the focal volume, and reduced photodamage. These properties allow MPM to image samples non-invasively, acting as a form o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
80
0

Year Published

2009
2009
2023
2023

Publication Types

Select...
4
4
1

Relationship

0
9

Authors

Journals

citations
Cited by 101 publications
(80 citation statements)
references
References 36 publications
0
80
0
Order By: Relevance
“…Comparatively, line scanning TFMPEM has a uniformly circular beam profile that can achieve the same AEC as a point scanning microscope [43][44][45]. However, line scanning TFMPEM requires additional components and mechanisms to complete two-dimensional imaging.…”
Section: Introductionmentioning
confidence: 99%
“…Comparatively, line scanning TFMPEM has a uniformly circular beam profile that can achieve the same AEC as a point scanning microscope [43][44][45]. However, line scanning TFMPEM requires additional components and mechanisms to complete two-dimensional imaging.…”
Section: Introductionmentioning
confidence: 99%
“…[1] ), but recent work in nonlinear microscopy [2][3][4], micromachining [5,6] and waveguide writing [7] has taken advantage of the special properties of these beams. When a beam that has transverse spatial chirp is focused with a lens or curved mirror, the axial intensity is strongly localized because the pulse duration is not its shortest until all frequency components are fully overlapped.…”
Section: Introductionmentioning
confidence: 99%
“…Taking the transverse excitation regime as example, and assuming the higher order chirp is absent [54], then the control beam with Gaussian spectrum and Gaussian transverse profile can be written in the frequency domain as…”
Section: +mentioning
confidence: 99%