1979
DOI: 10.1021/bk-1979-0102.ch003
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Simultaneous Multielement Determinations by Atomic Absorption and Atomic Emission with a Computerized Echelle Spectrometer/Imaging Detector System

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“…Geometric registration on the ISPD is excellent, 1 diode (Talmi and Simpson, 1980); therefore, wavelength accuracy was 0.5 nm with the 152 grooves/mm grating. Resolution was a function of the grating and the slit width and was empirically determined as the product of the reciprocal linear dispersion and the FWHM of one of the mercury lines (Felkel and Pardue, 1979). Experimentally determined resolution was: 2 nm using the 0.025 mm slit, 3 nm with the 0.1 mm slit, and with the 1 mm slit it was 9 nm using the fiber optic input and 20 nm using the lens system or no collection optics.…”
Section: Accuracy and Resolutionmentioning
confidence: 99%
“…Geometric registration on the ISPD is excellent, 1 diode (Talmi and Simpson, 1980); therefore, wavelength accuracy was 0.5 nm with the 152 grooves/mm grating. Resolution was a function of the grating and the slit width and was empirically determined as the product of the reciprocal linear dispersion and the FWHM of one of the mercury lines (Felkel and Pardue, 1979). Experimentally determined resolution was: 2 nm using the 0.025 mm slit, 3 nm with the 0.1 mm slit, and with the 1 mm slit it was 9 nm using the fiber optic input and 20 nm using the lens system or no collection optics.…”
Section: Accuracy and Resolutionmentioning
confidence: 99%