“…In general, there is a strong push to combine NAP-XPS with structural techniques and/or lateral resolution. In addition to grazing incidence X-ray scattering, 101 examples include its combination with SWAPPS 53,55–57 (Section 2.7), where there are now prospects to extend the technique to studies at elevated temperature, 57 and near-edge X-ray absorption fine structure (NEXAFS). 102 Combination with scanning photoelectron microscopy (SPEM) adds lateral imaging capability to the picture, and is implemented with NAP-XPS, for example, at the ESCA Microscopy beamline at Elettra (Trieste), offering sub-μm resolution.…”