2021
DOI: 10.1063/5.0044162
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Simultaneous ambient pressure x-ray photoelectron spectroscopy and grazing incidence x-ray scattering in gas environments

Abstract: We have developed an experimental system to simultaneously observe surface structure, morphology, composition, chemical state, and chemical activity for samples in gas phase environments. This is accomplished by simultaneously measuring X-ray photoelectron spectroscopy (XPS) and grazing incidence X-ray scattering (GIXS) in gas pressures as high as the multi-Torr regime, while also recording mass spectrometry. Scattering patterns reflect near-surface sample structures from the nano-to the meso-scale. The grazin… Show more

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Cited by 18 publications
(12 citation statements)
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References 49 publications
(53 reference statements)
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“…This was done using a recently developed system enabling simultaneous in situ APXPS and APGIXS measurements on the same sample region. 16 The X-ray scattering geometry is shown in Fig. 4a, along with an illustration of its orientation with respect to the APXPS aperture of the hemispherical analyzer.…”
Section: Resultsmentioning
confidence: 99%
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“…This was done using a recently developed system enabling simultaneous in situ APXPS and APGIXS measurements on the same sample region. 16 The X-ray scattering geometry is shown in Fig. 4a, along with an illustration of its orientation with respect to the APXPS aperture of the hemispherical analyzer.…”
Section: Resultsmentioning
confidence: 99%
“…More details on this setup can be found in ref. 16. A stainless steel beamstop was applied to block the reflected specular X-ray beam from saturating or even damaging the CCD camera.…”
Section: Methodsmentioning
confidence: 99%
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“…In general, there is a strong push to combine NAP-XPS with structural techniques and/or lateral resolution. In addition to grazing incidence X-ray scattering, 101 examples include its combination with SWAPPS 53,55–57 (Section 2.7), where there are now prospects to extend the technique to studies at elevated temperature, 57 and near-edge X-ray absorption fine structure (NEXAFS). 102 Combination with scanning photoelectron microscopy (SPEM) adds lateral imaging capability to the picture, and is implemented with NAP-XPS, for example, at the ESCA Microscopy beamline at Elettra (Trieste), offering sub-μm resolution.…”
Section: In Situ Methods: Developments In Near-ambient Pressure Xpsmentioning
confidence: 99%
“…The near-and far-field scattering profiles and images can be recorded simultaneously using this probe. In addition, this has application in the investigation of the chemical information and electronic structure of materials by measuring X-ray absorption/emission spectra with the tunable energy of synchrotron X-rays and photoelectron spectroscopy simultaneously (Sanchez-Cano et al, 2021; Timoshenko & Cuenya, 2021; Kersell et al, 2021).…”
Section: Introductionmentioning
confidence: 99%