Simulation of integrated circuit immunity with LECCS model

Ichikawa, Kouji; Inagaki, Michio; Sakurai, Yasuhisa; Iwase, Isao; Nagata, Makoto; Wada, Osami

doi:10.1109/emczur.2006.214932

Cited by 24 publications

(12 citation statements)

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“…Various electromagnetic models have been generated to predict the behavior of the ICs in electromagnetic environment [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. Integrated circuit emission model (ICEM) [1][2][3][4][5][6][7][8][9] and Linear equivalent circuit and current source (LECCS) model [1,10] has been used for prediction of electromagnetic emission of ICs. Input/Output buffer information specification (IBIS) has been used for printed circuit board (PCB) analysis is the other emission model [11,12].…”

Section: * This Study Was Supported By the Istanbul University Scientmentioning

confidence: 99%

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Dynamic current activity measurement for integrated circuit emission model

Başak

Kuntman

2013

2013 8th International Conference on Electrical and Electronics Engineering (ELECO)

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This paper describes the current activity measurement and modeling of integrated circuits for electromagnetic conducted emission. In this study, a test circuit including the MC9S12XMAG-family microcontroller was designed and measurements were made to confirm the applied measurement techniques. Moreover, internal current was obtained from the measured external current which is described as a dynamic current activity on the die. The input impedance measurements were performed in the frequency range from 1MHz to 2GHz. The passive distribution network was extracted with the differential evolution algorithm from the measured impedance -frequency curve and results were compared with the measurements. The external current was measured by the spectrum analyzer has been used to obtain the internal current of the die. Extracted passive distribution network and internal activity component values have been given to obtain the integrated circuit emission model.

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Section: * This Study Was Supported By the Istanbul University Scientmentioning

confidence: 99%

“…Internal activity is the independent current source or voltage source and inter block coupling provides the coupling impedances between blocks and they can be resistive, capacitive and magnetic [9][10][11][12].…”

Section: The Passive Distribution Network Measurement and Modellingmentioning

confidence: 99%

Dynamic current activity measurement for integrated circuit emission model

Başak

Kuntman

2013

2013 8th International Conference on Electrical and Electronics Engineering (ELECO)

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“…The input/output buffer information specification [4] was developed in the early 1990s to describe the electrical performance of the I/O structures of an IC. However, this model does not take into account the main source of IC parasitic emissions, i.e., the Manuscript On the other hand, the "linear equivalent circuit and current source" (LECCS) model [5], [6] is an electrical model originally proposed for the core circuits of ICs and large-scale integration's immunity model. The LECCS model is able to predict the conducted emissions and analyze the immunity of the ICs up to 1 GHz.…”

Section: Introductionmentioning

confidence: 99%

Characterization and Modeling of the Conducted Emission of Integrated Circuits Up To 3 GHz

Berbel

Fernández‐García

Gil

2014

IEEE Trans. Electromagn. Compat.

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In this paper, an electrical model in order to predict the electromagnetic compatibility (EMC) conducted emission of integrated circuits (ICs) up to 3 GHz is presented. The electrical model predicts the behavior of the propagation paths of electromagnetic conducted emissions at high frequency by including all distributed effects and capacitive and inductive couplings. The proposed model has been compared with the standard IC emission model (ICEM-CE) to predict the EMC of a clock generator by means of the feature selective validation (FSV) method. The results show that the proposed model can expand the frequency range up to 3 GHz with a high degree of accuracy. Moreover, an alternative approach to model the electromagnetic noise that is based on the analysis of its spectral components is proposed. Index Terms-Conducted emissions, electromagnetic compatibility (EMC), feature selective validation (FSV), integrated circuit (IC), IC emission model (ICEM-CE), internal activity (IA).

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“…Two IEC standards on the immunity of ICs are now under construction: one for the test [1] and the other for the modelling [2]. Complex ICs, such as microcontrollers, have become the central topic of the IC immunity since the beginning of the 2000s [3][4][5][6].…”

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confidence: 99%

Dependence of electromagnetic immunity of microcontrollers on system clock frequency

Wang

Unger

et al. 2012

Electron. Lett.

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To test and to model the conducted radio frequency electromagnetic immunity of a reconfigurable integrated circuit like microcontrollers is complex because the configuration parameter is variable. A study is presented of the dependence of immunity on one of the configuration parameters -the system clock. The theoretical analysis shows that the immunity is independent of the clock frequency in the frequency range of interest. Measurement results support the theoretical prediction.

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Simulation of integrated circuit immunity with LECCS model

Cited by 24 publications

References 0 publications

Dynamic current activity measurement for integrated circuit emission model

Dynamic current activity measurement for integrated circuit emission model

Characterization and Modeling of the Conducted Emission of Integrated Circuits Up To 3 GHz

Dependence of electromagnetic immunity of microcontrollers on system clock frequency

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