Simulation and Ground Test for the Total Ionizing Dose Effects of STSAT-2

Ryu, Kwang‐Sun; Shin, Goo-Hwan; Kim, Hyung-Myung; Kim, Sung-Joon; Ko, Dai-Ho; Kim, Hee‐Jun; Min, Kyoung‐Wook

doi:10.3938/jkps.50.1552

Cited by 5 publications

(2 citation statements)

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“…Additionally, an upgraded version called CREME2009 (https://creme.isde.vanderbilt.edu/) was released. Since no such information was provided earlier on the Website, CREME96 was extensively used for periods after 1997 as well [e.g., Gustafsson et al , 2010; Sihver et al , 2010; Ryu et al , 2007; Palfalvi et al , 2008]. In order to estimate the accuracy of CREME96 and the reliability of published estimations of the radiation exposure in space using this model for time periods after 1997, CREME96 was included in the comparison even for times after the official period of validity.…”

Section: Galactic Cosmic Ray Modelsmentioning

confidence: 99%

Assessment of galactic cosmic ray models

Mrigakshi¹,

Matthiä²,

Berger³

et al. 2012

J. Geophys. Res.

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[1] Among several factors involved in the development of a manned space mission concept, the astronauts' health is a major concern that needs to be considered carefully. Galactic cosmic rays (GCRs), which mainly consist of high-energetic nuclei ranging from hydrogen to iron and beyond, pose a major radiation health risk in long-term space missions. It is therefore required to assess the radiation exposure of astronauts in order to estimate their radiation risks. This can be done either by performing direct measurements or by making computer based simulations from which the dose can be derived. A necessary prerequisite for an accurate estimation of the exposure using simulations is a reliable description of the GCR spectra. The aim of this work is to compare GCR models and to test their applicability for the exposure assessment of astronauts. To achieve this, commonly used models capable of describing both light and heavy GCR particle spectra were evaluated by investigating the model spectra for various particles over several decades. The updated Badhwar-O'Neill model published in the year 2010, CREME2009 which uses the International Standard model for GCR, CREME96 and the Burger-Usoskin model were examined. Hydrogen, helium, oxygen and iron nuclei spectra calculated by the different models are compared with measurements from various high-altitude balloon and space-borne experiments. During certain epochs in the last decade, there are large discrepancies between the GCR energy spectra described by the models and the measurements. All the models exhibit weaknesses in describing the increased GCR flux that was observed in

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Section: Galactic Cosmic Ray Modelsmentioning

confidence: 99%

Assessment of galactic cosmic ray models

Mrigakshi¹,

Matthiä²,

Berger³

et al. 2012

J. Geophys. Res.

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“…There was an attempt made to monitor the space radiation environment using radiationsensitive field effect transistor (RADFET) (Kim et al 2006) as a total dose indicator. Subsequent studies and experiments also included single-event effects, using proton beam facilities (Lim et al 2006, Ryu et al 2007. As heavy ion facilities are not yet available in Korea, the ground tests of single-event effects are restricted to using proton beam line.…”

Section: Introductionmentioning

confidence: 99%

Heavy-Ion Radiation Characteristics of DDR2 Synchronous Dynamic Random Access Memory Fabricated in 56 nm Technology

Ryu¹,

Park²,

Chae³

et al. 2012

Journal of Astronomy and Space Sciences

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We developed a mass-memory chip by staking 1 Gbit double data rate 2 (DDR2) synchronous dynamic random access memory (SDRAM) memory core up to 4 Gbit storage for future satellite missions which require large storage for data collected during the mission execution. To investigate the resistance of the chip to the space radiation environment, we have performed heavy-ion-driven single event experiments using Heavy Ion Medical Accelerator in Chiba medium energy beam line. The radiation characteristics are presented for the DDR2 SDRAM (K4T1G164QE) fabricated in 56 nm technology. The statistical analyses and comparisons of the characteristics of chips fabricated with previous technologies are presented. The crosssection values for various single event categories were derived up to ~80 MeVcm 2 /mg. Our comparison of the DDR2 SDRAM, which was fabricated in 56 nm technology node, with previous technologies, implies that the increased degree of integration causes the memory chip to become vulnerable to single-event functional interrupt, but resistant to single-event latch-up.

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