SIMS imaging of the nanoworld: applications in science and technology

Development and characterization of an iodine field emission ion source for focused ion beam applicationsHigh brightness inductively coupled plasma source for high current focused ion beam applications Performance of multicusp plasma ion source for focused ion beam applicationsWe report measurements and modeling of an ion source that is based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam systems. Our measurements of total ion current as a function of ionization conditions support an analytical model that also predicts the cross-sectional current density and spatial distribution of ions created in the source. The model predicts a peak brightness of 2 Â 10 7 A m À2 sr À1 eV À1 and an energy spread less than 0.34 eV. The model is also combined with Monte-Carlo simulations of the inter-ion Coulomb forces to show that the source can be operated at several picoamperes with a brightness above 1 Â 10 7 A m À2 sr À1 eV À1 . We estimate that when combined with a conventional ion focusing column, an ion source with these properties could focus a 1 pA beam into a spot smaller than 1 nm. A total current greater than 5 nA was measured in a lowerbrightness configuration of the ion source, demonstrating the possibility of a high current mode of operation.

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“…It also may offer additional analytical capabilities by improving the performance of site-specific SIMS. 15 …”

Section: Introductionmentioning

confidence: 99%

Cold atomic beam ion source for focused ion beam applications

Knuffman

Steele

McClelland

2013

Journal of Applied Physics

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“…Growth studies at the single-nanoparticle level elucidate the mechanics of the plasmon-driven process and clarify the anisotropic growth mechanism. Nanoscale secondary-ion mass spectrometry (NanoSIMS) 19 was employed to probe the physical location of the surfactant polyvinylpyrrolidone (PVP) on individual Au nanostructures at the molecular level, revealing that it preferentially adsorbs onto twinplane defects along the nanoprism perimeter instead of the top {111} facets as previously suggested. Electrochemical studies on Au nanocrystal electrodes further demonstrate that adsorbed PVP facilitates the accumulation of hot electrons on the metal under optical excitation.…”

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confidence: 98%

Polyvinylpyrrolidone-induced anisotropic growth of gold nanoprisms in plasmon-driven synthesis

et al. 2016

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After more than a decade, it is still unknown whether the plasmon-mediated growth of silver nanostructures can be extended to the synthesis of other noble metals, as the molecular mechanisms governing the growth process remain elusive. Herein, we demonstrate the plasmon-driven synthesis of gold nanoprisms and elucidate the details of the photochemical growth mechanism at the single-nanoparticle level. Our investigation reveals that the surfactant polyvinylpyrrolidone preferentially adsorbs along the nanoprism perimeter and serves as a photochemical relay to direct the anisotropic growth of gold nanoprisms. This discovery confers a unique function to polyvinylpyrrolidone that is fundamentally different from its widely accepted role as a crystal-face-blocking ligand. Additionally, we find that nanocrystal twinning exerts a profound influence on the kinetics of this photochemical process by controlling the transport of plasmon-generated hot electrons to polyvinylpyrrolidone. These insights establish a molecular-level description of the underlying mechanisms regulating the plasmon-driven synthesis of gold nanoprisms.

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“…The ability of time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to map the distribution of elements or compounds on the surface of an imaged sample is well known and frequently used in organic and in‐organic materials characterization. In the present, ToF‐SIMS instruments can reach a lateral resolution of below 100 nm with a typical mass resolution of m/Δm = 5000. Although the sensitivity and lateral resolution are sufficient in many cases, the identification and chemical characterization of features such as cracks, grains, grain, and phase boundaries on metallic samples degraded by hydrogen interaction can be further improved by data fusion with images delivered by methods, which provide highly resolved topography information.…”

Section: Introductionmentioning

confidence: 97%

First use of data fusion and multivariate analysis of ToF‐SIMS and SEM image data for studying deuterium‐assisted degradation processes in duplex steels

Sobol

Holzlechner

Holzweber

et al. 2016

Surface & Interface Analysis

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a Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high-resolution scanning electron microscopy are wellacknowledged tools in materials characterization. The ability to map chemical species on the surface of an investigated sample with often low mass detection limits makes ToF-SIMS an essential tool in fields where many question marks concerning degradation processes and damage mechanisms exist. The aim of this paper is to describe the power of data fusion of ToF-SIMS and high-resolution scanning electron microscopy results employing computational methods for multivariate data analysis such as principal component analysis. As a case study the investigation of hydrogen distribution in an artificially charged duplex stainless steel microstructure is presented aiming on a better understanding of hydrogen embrittlement.

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SIMS imaging of the nanoworld: applications in science and technology

Cited by 66 publications

References 218 publications

Cold atomic beam ion source for focused ion beam applications

Cold atomic beam ion source for focused ion beam applications

Polyvinylpyrrolidone-induced anisotropic growth of gold nanoprisms in plasmon-driven synthesis

First use of data fusion and multivariate analysis of ToF‐SIMS and SEM image data for studying deuterium‐assisted degradation processes in duplex steels

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