In this study, the contribution of grain boundaries to the oxygen reduction and diffusion kinetics of La0.8Sr0.2MnO3 (LSM) thin films is investigated. Polycrystalline LSM thin films with columnar grains of different grain sizes as well as epitaxial thin films were prepared by pulsed laser deposition. (18)O tracer exchange experiments were performed at temperatures from 570 °C to 810 °C and subsequently analyzed by secondary ion mass spectrometry (SIMS). The isotope concentration depth profiles of polycrystalline films clearly indicate contributions from diffusion and surface exchange in grains as well as in grain boundaries. Measured depth profiles were analyzed by finite element modeling and revealed the diffusion coefficients D and oxygen exchange coefficients k of both the grain bulk and grain boundaries. Values obtained for grain boundaries (Dgb and kgb) are almost three orders of magnitude higher than those of the grains (Dg and kg). Hence, grain boundaries may not only facilitate fast oxygen diffusion but also fast oxygen exchange kinetics. Variation of the A-site stoichiometry ((La0.8Sr0.2)0.95MnO3) did not lead to large changes of the kinetic parameters. Properties found for epitaxial layers without grain boundaries (Db and kb) are close to those of the grains in polycrystalline layers.

Oxygen isotope exchange with subsequent time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a highly valuable tool for determining oxygen diffusion coefficients in oxides. Since ToF-SIMS analysis enables an elemental and chemical mapping, it can also be used to visualize oxygen exchange-active zones by determining the local oxygen isotopic fraction. However, measuring accurate isotopic fractions can be a challenging analytical task owing to secondary ion interaction and signal saturation, particularly when dealing with high secondary ion intensities as commonly found when analyzing oxygen ions from oxides. It is shown that in many cases the calculated 18 O À fraction erroneously shifts to higher values and can lead to systematic errors in the determination of diffusion coefficients. A novel ToF-SIMS operation mode, called "Collimated Burst Alignment" (CBA) mode, is therefore introduced to enable a more accurate determination of oxygen isotopic fractions with an optimized lateral resolution of sub-100 nm. Both improvements are rendered possible by a modified beam guidance in the primary ion gun. This modification reduces detector dead time effects and ion interactions to a minimum and secondary ion intensities can be obtained more accurately. The result of this optimization is demonstrated in measurements of the natural isotope abundance of several different oxides including SrTiO 3 and Sr-doped LaCoO 3 .

HighlightsA novel ToF-SIMS mode and its performance and application is described.CBA mode allows measurements with sub 100 nm lateral resolution.Adjusting the primary ion current is possible for accurate oxygen isotope analysis.4 application examples show novel or improved scientific results using CBA mode.

The considerable potential of model-type thin film electrodes for the investigation of oxygen exchange pathways is demonstrated for different electrode materials on yttria-stabilized zirconia (YSZ). In particular, a correlation of voltage-driven 18 O tracer experiments and electrical ac and dc measurements has proven to be helpful when aiming at mechanistic conclusions. For Pt electrodes, two different parallel reaction pathways can be identified under equilibrium conditions. At lower temperatures, a diffusion limited path through the electrode is dominant, whereas at higher temperatures, an electrode surface path with oxygen incorporation at the three-phase boundary determines the electrochemical activity. In addition, for high cathodic polarization, an electrolyte surface path with electron transfer via YSZ outperforms both other pathways. The oxygen incorporation zones of the bulk path as well as the electrolyte surface path can be visualized by 18 O tracer incorporation experiments in combination with time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis. A successful separation of surface and bulk path can also be obtained for La 0.8 Sr 0.2 MnO 3Àd (LSM) electrodes by means of 18 O tracer incorporation at different cathodic overpotentials. Under lower polarization, a surface path with oxygen incorporation at the three-phase boundary is dominant, whereas at higher cathodic overpotential, the bulk path becomes significantly more pronounced. These changes are discussed in terms of polarization-induced changes of the ionic conductivity in the LSM electrode. Measurements on the acceptor-doped perovskite-type materials La 0.6 Sr 0.4 CoO 3Àd (LSC) and La 0.6 Sr 0.4 FeO 3Àd (LSF) illustrate the limitations of the tracer incorporation method. In the case of highly active LSC electrodes with low polarization resistances, the tracer distribution is determined by the electrolyte, and thus the active sites of the electrodes can no longer be visualized. The effect of polarization-induced changes of the electrode's electronic conductivity is demonstrated for LSF. Only a region close to the current collector remains electrochemically active owing to limited lateral electron transport.

Oxygen ion conduction in Nd 3+ -doped Pb(Zr x Ti 1 -x )O 3 (PZT) was investigated by impedance spectroscopy and 18 O-tracer diffusion with subsequent secondary ion mass spectrometry (SIMS) analysis. Ion blocking electrodes lead to a second relaxation feature in impedance spectra at temperatures above 600°C. This allowed analysis of ionic and electronic partial conductivities. Between 600°C and 700°C those are in the same order of magnitude (10-4 S/cm) though very differently activated (2.4 eV vs. 1.2 eV for ions and electron holes, respectively). Oxygen tracer experiments showed that ion transport mainly takes place along grain boundaries with partly very high local ionic conductivities. Numerical analysis of the tracer profiles, including a near-surface space charge zone, revealed bulk and grain-boundary diffusion coefficients. Calculation of an effective ionic conductivity from these diffusion coefficients showed good agreement with conductivity values determined from impedance measurements. Based on these data oxygen vacancy concentrations in grain boundary and bulk could be estimated. Annealing at high temperatures caused a decrease in the grain-boundary ionic conductivity and onset of additional defect chemical processes near the surface, most probably due to cation diffusion.

No abstract

No abstract

a Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high-resolution scanning electron microscopy are wellacknowledged tools in materials characterization. The ability to map chemical species on the surface of an investigated sample with often low mass detection limits makes ToF-SIMS an essential tool in fields where many question marks concerning degradation processes and damage mechanisms exist. The aim of this paper is to describe the power of data fusion of ToF-SIMS and high-resolution scanning electron microscopy results employing computational methods for multivariate data analysis such as principal component analysis. As a case study the investigation of hydrogen distribution in an artificially charged duplex stainless steel microstructure is presented aiming on a better understanding of hydrogen embrittlement.