Simple Diophantine test for the validity of conventional deep level transient spectroscopy

Abstract

A deeplevel transient spectroscopy study of high electron mobility transistors subjected to lifetime stress tests

Application of the singular valve decomposition–Prony method for analyzing deep-level transient spectroscopy capacitance transients

“…In the literature, there are methods reported for testing the single-exponential hypothesis, such as the ''simple'' Diophantine test by Batovski and Hardalov. 20 The Diophantine test is applicable to either conventional analog DLTS or to digital capacitance-transient capture that is analyzed in the conventional manner ͑i.e., Lang's approach͒. We have applied the Diophantine test on the capacitance transients shown in Fig.…”

“…In fact, the principal weakness of the Diophantine test as presented in Ref. 20 is the lack of criteria for rejecting the single-exponential hypothesis. In contrast, the SVD-Prony algorithm performs a nearly perfect test of the single-exponential hypothesis under these conditions, as is demonstrated shortly.…”