“…XRD in Figure d was used to investigate the structural properties of the samples. The XRD pattern of Siloxene sheets exhibits prominent peaks at 15.2°, 26.7°, 28°, 37.4°, 47.2°, and 55.8°, which can be attributed to the (0 0 1), (1 0 0), (1 1 1), (2 1 0), (2 2 0), and (3 1 1) crystallographic planes, respectively. , These peaks arise from the topochemical transformation of layered calcium disilicide into two-dimensional (2D) silicon sheets [31]. Additionally, there is a peak marked by an asterisk (*), which indicates the presence of common impurities in the sample due to crystalline silicon .…”