2016
DOI: 10.1109/jlt.2015.2481602
|View full text |Cite
|
Sign up to set email alerts
|

Silicon Photonics R&D and Manufacturing on 300-mm Wafer Platform

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
54
0
1

Year Published

2016
2016
2023
2023

Publication Types

Select...
6
2
1

Relationship

2
7

Authors

Journals

citations
Cited by 103 publications
(59 citation statements)
references
References 16 publications
0
54
0
1
Order By: Relevance
“…The photo-receiver (RX) itself consists of a PIN photodiode with responsivity η OE = 0.9 A/W, analogue bandwidth BW PD = 21 GHz, a Trans-Impedance Amplifier (TIA) gain of 1 kΩ and a Noise Equivalent Power (NEP) of 8 pW/ √ GHz. These RX parameters are typical for 25 Gbps systems [12] and, as will be evident later, do not change the generality of the results or of the proposed method. The transmission quality is evaluated by means of the Q-factor with patterning effects of the two nearest neighboring bits being taken into account in the calculation [13].…”
Section: Simulation Of the Input Power Required P Reqmentioning
confidence: 76%
“…The photo-receiver (RX) itself consists of a PIN photodiode with responsivity η OE = 0.9 A/W, analogue bandwidth BW PD = 21 GHz, a Trans-Impedance Amplifier (TIA) gain of 1 kΩ and a Noise Equivalent Power (NEP) of 8 pW/ √ GHz. These RX parameters are typical for 25 Gbps systems [12] and, as will be evident later, do not change the generality of the results or of the proposed method. The transmission quality is evaluated by means of the Q-factor with patterning effects of the two nearest neighboring bits being taken into account in the calculation [13].…”
Section: Simulation Of the Input Power Required P Reqmentioning
confidence: 76%
“…The two configurations differ mainly for the silicon thickness in the etched cladding regions, t: the first structure has t = 150 nm and is named SLOW150, while the second structure has t = 50 nm and is denoted as SLOW50. These values correspond to common technology platforms for optical interconnects [34]. To lock the lowest band edge at λ = 1.3 μm, the period has to be fixed as a = 218.1 nm and a = 234.7 nm for SLOW150 and SLOW50 configurations, respectively.…”
Section: Slow Light In Silicon Waveguide Gratingsmentioning
confidence: 99%
“…The combination of slow light and interleaved p-n junction is shown here to yield a modulation efficiency that is considerably improved with respect to standard modulators or to the use of both effects alone, while retaining a wide bandwidth that is essential for optical communication. The designed structure fulfills the required constraints for fabrication on industrial technology platforms [34], and may be suitable for the realization of MZ modulators with reduced energy dissipation.…”
Section: Introductionmentioning
confidence: 99%
“…Significant research effort has been dedicated over the past years to the development of silicon-based photonic technologies [1][2]. Developing high performance silicon modulators based on the free-carrier plasma dispersion (FCPD) effect has been an important milestone.…”
Section: Introductionmentioning
confidence: 99%