We present the performance of 4-channel × 25 Gb/s all-silicon photonic receivers based on hybrid-integrated vertical Ge-on-bulk-silicon photodetectors with 65nm bulk CMOS front-end circuits, characterized over 100 Gb/s. The sensitivity of a single-channel Ge photoreceiver module at a BER = 10 -12 was measured -11 dBm at 25 Gb/s, whereas, the measured sensitivity of a 4-ch Ge photoreceiver was -10.06 ~ -10.9 dBm for 25Gb/s operation of each channel, and further improvement is in progress. For comparison, we will also present the performance of a 4-ch × 25 Gb/s photoreceiver module, where commercial InP HBT-based front-end circuits is used, characterized up to 100 Gb/s.