2019
DOI: 10.1109/lpt.2019.2895095
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Silicon-Nitride-Assisted Edge Coupler Interfacing With High Numerical Aperture Fiber

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Cited by 33 publications
(16 citation statements)
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“…Due to the low coupling losses of single-edge couplers, a cut-back method is usually applied in the testing of edge couplers to measure the coupling efficiency [26,68,108] assisted with multiple auxiliary sets of ultra-long straight waveguides and bends to acquire accurate experimental results. In some situations, fiber array can be customized to place at one facet or both facets to ease the alignment issue.…”
Section: An Overall Overview Of Edge Coupler Performancementioning
confidence: 99%
See 1 more Smart Citation
“…Due to the low coupling losses of single-edge couplers, a cut-back method is usually applied in the testing of edge couplers to measure the coupling efficiency [26,68,108] assisted with multiple auxiliary sets of ultra-long straight waveguides and bends to acquire accurate experimental results. In some situations, fiber array can be customized to place at one facet or both facets to ease the alignment issue.…”
Section: An Overall Overview Of Edge Coupler Performancementioning
confidence: 99%
“…Although N-H and Si-H bonds absorption exists in the C-band, it can be avoided by choosing LPCVD instead of PECVD. Thirdly, SiN can support high optical power and is less sensitive to thermal change compared with Si, which means that it is possible to integrate active devices into a silicon photonic platform with the aid of SiN [108].…”
Section: Multilayer Silicon Nitride-on-silicon Photonic Integrated Plmentioning
confidence: 99%
“…It is important to note that the selected device performances were for Si and Si 3 N 4 components that follow similar designs to the AlGaAsOI components that are relevant and routinely used for QPICs. For example, sub-edge couplers with 0.35 dB of loss have been fabricated using silicon with silicon nitride, but these were achieved with multiple layers 58 . Here we compare similar component designs across the three platforms-using only a single photonic layer and standard photolithography to fabricate the devices.…”
Section: Discussionmentioning
confidence: 99%
“…The high fiber-to-chip test loss was mainly caused by the high edge coupling loss, which was over 5 dB for each end. It can be further optimized by designing trident spot-size converter (SSC) [30] combining three misplaced tapers or other high-efficiency couplers with air trenches [31].…”
Section: Discussionmentioning
confidence: 99%