2016
DOI: 10.1109/ted.2016.2612237
|View full text |Cite
|
Sign up to set email alerts
|

Silicon Carbide for Realization of “Telescope” Ion Detectors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
5
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
8

Relationship

1
7

Authors

Journals

citations
Cited by 10 publications
(5 citation statements)
references
References 15 publications
0
5
0
Order By: Relevance
“…The higher bandgap (3.26 eV) compared to the Silicon one (1.12 eV) allows to be "blind" to the visible light [2,3], decreasing the noise to the visible light emission, particularly useful for applications in plasma diagnostics [4,5]. Moreover, the higher electron mobility allows a high count rate frequency, while the low reverse current (two-three orders of magnitude lower with respect to silicon, at room temperature) and the high displacement energy of 25 eV with respect to the Si (of 15 eV) make such detectors resistant to the high temperatures [6] and to the radiation doses [7]. Silicon Carbide (SiC) detectors were tested at MUT (Military University of Technology, Warsaw, Poland) to detect plasma created from a double-stream gas-puff target [8] in TOF (time-offlight) mode.…”
mentioning
confidence: 99%
“…The higher bandgap (3.26 eV) compared to the Silicon one (1.12 eV) allows to be "blind" to the visible light [2,3], decreasing the noise to the visible light emission, particularly useful for applications in plasma diagnostics [4,5]. Moreover, the higher electron mobility allows a high count rate frequency, while the low reverse current (two-three orders of magnitude lower with respect to silicon, at room temperature) and the high displacement energy of 25 eV with respect to the Si (of 15 eV) make such detectors resistant to the high temperatures [6] and to the radiation doses [7]. Silicon Carbide (SiC) detectors were tested at MUT (Military University of Technology, Warsaw, Poland) to detect plasma created from a double-stream gas-puff target [8] in TOF (time-offlight) mode.…”
mentioning
confidence: 99%
“…The inset shows a zoom of the ΔE − E plot for small ΔE values. b Uncalibrated ΔE − E plot obtained in the reaction 68 Ni + 12 C at 28 MeV/nucleon considering two subsequently crossed strips of a FARCOS telescope (adapted from [144]) sections under plasma environment of fundamental importance for nuclear astrophysics [143].…”
Section: Asfin: Pushing the Low-thickness Limit Of Solid-state Devicesmentioning
confidence: 99%
“…The presented SiC detectors can be employed to monitor plasma produced from compact laboratory sources and from large facilities such as accelerators and for transport of charge particle beams. They can be employed to analyze the ion-gas and ion-thin foil interactions in stripper systems producing SXR emission, for RBS, ERDA, NRA, and PIXE analysis, for electron and ion detection in the time-of-flight configuration, and for spectroscopy, monitoring the production of characteristic x-ray emission, as reported widely in the literature [6,7,8,9,[11][12][13][14][15][16]21]. SiC detectors present a significant advantage with respect to the traditional Si detector, due to the higher-energy band gap, which makes the detector less sensitive to the VIS light produced by the laserproduced plasma.…”
Section: Discussionmentioning
confidence: 99%
“…The suitability of high-quality epitaxial layers allows the fabrication of high-performance SiC detectors based on Schottky diodes and p-n junctions. The SiC detectors show many advantages with respect to silicon [8], such as their high efficiency, working temperature, and very short rise time, due to their particular design that leaves a fraction of the active region directly exposed to the impinging radiation [9]. Moreover, their high displacement energy (of 25 eV with respect to the Si of 15 eV) [10] makes them high temperature and radiation resistant, and their high electron and hole mobility allows us to use them for high-frequency counting mode operation.…”
Section: Introductionmentioning
confidence: 99%