1998
DOI: 10.1016/s0921-5107(97)00217-1
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Si/SiO2 etching in high density SF6/CHF3/O2 plasma

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Cited by 17 publications
(8 citation statements)
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“…This can be seen in the SEM profiles of samples which were etched with an excess of oxygen above the optimal condition, resulting in a poorly treated surface, due to the decreased etch rate as mentioned beforehand . This observation is also illustrated in Figure (d), which shows how the etch rate initially increases with increasing oxygen ratio up to an optimum value of 16% before a reverse trend is seen, with the etch rate decreasing with additional increase of oxygen by volume.…”
Section: Resultsmentioning
confidence: 56%
“…This can be seen in the SEM profiles of samples which were etched with an excess of oxygen above the optimal condition, resulting in a poorly treated surface, due to the decreased etch rate as mentioned beforehand . This observation is also illustrated in Figure (d), which shows how the etch rate initially increases with increasing oxygen ratio up to an optimum value of 16% before a reverse trend is seen, with the etch rate decreasing with additional increase of oxygen by volume.…”
Section: Resultsmentioning
confidence: 56%
“…The plasma etching relies either on CF 4 , [20][21][22][23] SF 6 , 1,[20][21][22][23][24] or CHF 3 [25][26][27][28] gases as the main etching precursors. The etched gases are frequently disassociated into radicals, which are used for the chemical etching possibly through a plasma etching mechanism.…”
Section: Resultsmentioning
confidence: 99%
“…More etching occurred on the silicon at 302 mTorr (figure 2(d)) so that most of the needle-like structures are etched away and we get a smooth surface which results in high reflectance. The increased presence of oxygen at the higher chamber pressures result in better dissociation [15] of the fluoride and the larger number of fluorine ions leads to the enhanced etching.…”
Section: Discussion and Resultsmentioning
confidence: 99%