Si(Li) efficiency curve for X-ray parallel beam

Dias, Mauro S.; Renner, Cleide

doi:10.1016/0029-554x(82)90679-6

Cited by 9 publications

(1 citation statement)

References 2 publications

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“…The energy and efficiency calibration of the Si(Li) detector was made, before and after the experiment, using Fe 5s, Co 57 and Am T M standard radioactive sources. For the efficiency calibration of the detector, the absolute intensities of different X-ray and ?-ray lines of Fe 55, Co 57 and Am ~-'1 were taken from the Table of isotopes [23], Dias and Renner [24] and Cohen [25] respectively• The integrated electrical current of the beam as measured by the Faraday cup, was kept as low as 10 nA, so as to avoid pile up effects and damage to the target• Three Canberra 8075 ADCs used to connect the outputs of the three amplifiers to the CAMAC system, which in turn connected these to the VAX computer for data acquisition and storage•…”

Section: Experimental Methodsmentioning

confidence: 99%

L-shell ionization in Au by O5+-and Ni5+-ion impact

Goyal

Braich

Murlithar

et al. 1995

Z Phys D - Atoms, Molecules and Clusters

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Abstract. The L X-ray production cross sections in gold by 60 to 72 MeV 0 5 ÷ ions and 58 to 87 MeV Ni s-t-ions have been measured. The L-subshell ionization cross sections derived from these experimental results have been compared with the direct ionization theories viz. plane wave Born approximation (PWBA) theory and modified perturbed-stationary-state theory with energy loss, Coulomb deflection and relativistic effects (MECPSSR). A new procedure has been described to account for the

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Section: Experimental Methodsmentioning

confidence: 99%

L-shell ionization in Au by O5+-and Ni5+-ion impact

Goyal

Braich

Murlithar

et al. 1995

Z Phys D - Atoms, Molecules and Clusters

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Efficiency calibration of a Ge(In) semiconductor detector by thin‐ and thick‐arget PIXE

Katsanos

1994

X-Ray Spectrometry

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The efficiency of a Ge(In) semiconductor x-ray detector was measured in the energy region 1-25 keV using proton-induced x-rays from thick targets and from thin targets of standard thickness, and the results of the two calibration methods were compared. A proton energy of 2.00 MeV was used in an external beam facility. A model based on fundamental parameters (mass absorption coefficients, fluorescence yields and relative x-ray emission rates) was used to reproduce the experimental results.

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Efficiency calibration of Si(Li) and HpGe detectors in the energy range of 5–60 keV

Verma

1985

Pramana - J Phys

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Si(Li) efficiency curve for X-ray parallel beam

Cited by 9 publications

References 2 publications

L-shell ionization in Au by O5+-and Ni5+-ion impact

L-shell ionization in Au by O5+-and Ni5+-ion impact

Efficiency calibration of a Ge(In) semiconductor detector by thin‐ and thick‐arget PIXE

Efficiency calibration of Si(Li) and HpGe detectors in the energy range of 5–60 keV

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