Short single tests for circuits with arbitrary stuck-at faults at outputs of gates

Abstract

The following results are proved: any nonconstant Boolean function may be implemented by an irredundant circuit of gates in the basis {x& y, x, x ⊕ y ⊕ z} admitting a single fault detection test of length at most 2 with respect to arbitrary stuck-at faults at outputs of gates, there exists a six-place Boolean function ψ such that any nonconstant Boolean function may be implemented by an irredundant circuit of gates in the basis {ψ} admitting a single diagnostic test of length at most 3 with respect to arbitrary stuck-at faults at outputs of gates.