1992
DOI: 10.1109/33.206927
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Short-pulse propagation technique for characterizing resistive package interconnections

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Cited by 23 publications
(9 citation statements)
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“…(1). Therefore, we represent these parameters by the six adjustment parameters param[0] to param [5] of multi-objective optimization as follows: Fig. 6.…”
Section: Proposal Of a Fitting Methods Using Multi-objective Optimizationmentioning
confidence: 99%
See 1 more Smart Citation
“…(1). Therefore, we represent these parameters by the six adjustment parameters param[0] to param [5] of multi-objective optimization as follows: Fig. 6.…”
Section: Proposal Of a Fitting Methods Using Multi-objective Optimizationmentioning
confidence: 99%
“…However, since measurements contain noise or error that is specific to the measurements when the measurements are actually made, the conventional methods [5,6] of determining transmission line characteristics based on actual measurements had difficulty in obtaining accurate transmission line characteristics. The reason is that since the conventional methods directly derived the transmission line characteristics from the measurement results of only the frequency characteristics or only the time-based response waveform, the influence of noise or error that is specific to the measurements is directly reflected in the transmission line characteristics.…”
Section: Subjects Involved In Determining Transmission Line Charactermentioning
confidence: 99%
“…The data vector (y n ), which is the measured TDR-TDT response of the DUT, is used to form the matrices Y 1 …”
Section: A Extraction Of Polesmentioning
confidence: 99%
“…The methods currently available to extract frequency information from time domain reflectometry (TDR) and time domain transmission (TDT) measurements can be classified into five major categories: the short pulse technique [1], the layer peeling algorithm [2], time domain network analysis (TDNA) [3,4], impulse response approximation [5], and model optimization [6]. Each method has been developed to extract different sets of parameters and models for a given device under test (DUT).…”
Section: Introductionmentioning
confidence: 99%
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