2009 IEEE Aerospace Conference 2009
DOI: 10.1109/aero.2009.4839515
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SET characterization and mitigation in RTAX-S antifuse FPGAs

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Cited by 9 publications
(2 citation statements)
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“…Antifuse FPGA has good radiation resistance and high reliability. 26,27 Therefore, antifuse FPGA is taken as the core processing device. Complete the default power-on configuration from PROM, all reconfiguration from PROM and NOR flash, timed dynamic refresh (partial configuration) control from PROM and NOR flash, and complete on-orbit NOR flash injection program management with SRAM FPGA.…”
Section: Architecture Based On Virtex-5 In-orbit Refresh and Reconstr...mentioning
confidence: 99%
See 1 more Smart Citation
“…Antifuse FPGA has good radiation resistance and high reliability. 26,27 Therefore, antifuse FPGA is taken as the core processing device. Complete the default power-on configuration from PROM, all reconfiguration from PROM and NOR flash, timed dynamic refresh (partial configuration) control from PROM and NOR flash, and complete on-orbit NOR flash injection program management with SRAM FPGA.…”
Section: Architecture Based On Virtex-5 In-orbit Refresh and Reconstr...mentioning
confidence: 99%
“…Therefore, this design uses PROM as the default program configuration memory device for SRAM FPGA power-on, and NOR flash as the on-orbit injection program memory device. Antifuse FPGA has good radiation resistance and high reliability 26 , 27 . Therefore, antifuse FPGA is taken as the core processing device.…”
Section: Architecture Based On Virtex-5 In-orbit Refresh and Reconstr...mentioning
confidence: 99%