2014
DOI: 10.1016/j.micron.2014.03.002
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Serial sectioning methods for 3D investigations in materials science

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Cited by 83 publications
(53 citation statements)
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References 60 publications
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“…Standard tools in metallography, such as optical and electron micrography, return information limited to the microstructure of a sample surface, which may not be representative of the bulk material [4,10]. These techniques require extensive sample preparation and can return 3D sample reconstructions only by repeatedly removing a layer of material and characterizing the surface beneath [2,47]. Such processes are destructive and cannot be applied in situ, e.g.…”
Section: Introductionmentioning
confidence: 99%
“…Standard tools in metallography, such as optical and electron micrography, return information limited to the microstructure of a sample surface, which may not be representative of the bulk material [4,10]. These techniques require extensive sample preparation and can return 3D sample reconstructions only by repeatedly removing a layer of material and characterizing the surface beneath [2,47]. Such processes are destructive and cannot be applied in situ, e.g.…”
Section: Introductionmentioning
confidence: 99%
“…Efi mov 1 возможности применения этого метода для иссле-дований биосовместимых матриксов и клеточно-инженерных конструкций [4,5]. Метод СЭМ/ФИП позволяет выполнять наномасштабную реконструк-цию структуры различных материалов.…”
Section: Three-dimensional Analysis Of Micro-and Nanostructure Of Biounclassified
“…Этот метод основан на удалении слоев материала при помощи ионного распыления и последующего исследования поверхности образца при помощи СЭМ. Однако при исследованиях биологических и полимерных образцов этим методом могут возникать поврежде-ния поверхности электронным и ионным пучками и нежелательные структурные нарушения, к тому же электронно-микроскопический контраст на изобра-жениях поверхности после распыления может быть ограничен по ряду причин [1,6,7]. Эти недостатки методов электронной и рентге-новской томографии ограничивают их применение для анализа биологических и полимерных матери-алов, состоящих преимущественно из легких хи-мических элементов, и для исследования их трех-мерных микро-и наноструктурных характеристик необходимо использование комплементарных мето-дов микроскопии [8].…”
Section: Three-dimensional Analysis Of Micro-and Nanostructure Of Biounclassified
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“…A more sophisticated example is the use of a diamond knife to make 60 nm thick sections of the calcified and decalcified shell of the mussel Elliptio complanatus in order to study organic‐inorganic structures . This method is reminiscent of modern knife‐edge microscopy and serial block‐face scanning electron microscopy (SBEM) though these techniques are more suited for soft tissue . A conceptually similar technique, focused ion beam scanning electron microscopy (FIB‐SEM), can be used to generate 3D datasets by using a focused ion beam to mill away the material layer by layer, while each layer is imaged using an electron beam .…”
Section: Overview Of Finite Element Modeling and Analysismentioning
confidence: 99%