Sequential and combined acceleration tests for crystalline Si photovoltaic modules

Abstract

The sequential combination test for photovoltaic modules is effective for accelerating degradation to shorten the test time and for reproducing degradation phenomena observed in modules exposed outdoors for a long time. The damp-heat (DH) test, thermal-cycle (TC) test, humidity-freeze (HF) test or dynamic mechanical load (DML) test is combined for the test modules. It was confirmed that chemical corrosion degradation or physical mechanical degradation is reproduced by the combination of the above tests. Cracks on the back sheet and delamination, often observed upon outdoor exposure, were well reproduced by the combination of DH and TC tests and TC and HF tests, respectively. Sequential DH and TC tests and DML and TC tests accelerated the degradation. These sequential tests are expected to be effective in reducing the required time of indoor testing for ensuring long-term reliability.

Reliability and long term durability of bifacial photovoltaic modules using transparent backsheet

“…Moreover, the increase in R s is derived from the increase in contact resistance between the Ag finger electrode and the Si cell due to the production of acetic acid gas by the hydrolysis reaction of EVA. 13) Since the water vapor permeability of the backsheet used in this study is equivalent to that of the poly(vinyl fluoride) (PVF)=PET=PVF backsheet used in Masuda et al's study 25) and a similar EVA to that used in their report is used as the encapsulant, the durability of modules using bifacial cells and monofacial cells can be compared. Generally, a monofacial p-type Si cell includes an Al back surface field (BSF) on the whole rear surface.…”

Investigation of Degradation of Solar Photovoltaics: A Review of Aging Factors, Impacts, and Future Directions toward Sustainable Energy Management

“…Additionally, it was discovered that the PV deterioration rate had increased by 1.4% yearly, which is equal to India's 1.45% degradation rate for monocrystalline modules. Sequential and combined acceleration tests of crystalline Si photovoltaic modules were performed by Masuda et al [91]. Several variables contribute to degradation when exposed to the elements outside, such as high temperatures, high levels of humidity, thermal cycling, UV rays, current flow, high voltage, salt spray, and mechanical stress.…”

Annual trends of indoor output measurement results from photovoltaic modules exposed outdoors in Tosu city, Japan

“…On the other hand, it is known that the degradation of PV modules is caused by several factors, such as age deterioration, including connecting electrodes failures for the bus bar ribbon and fingers, [6][7][8][9] light-induced degradation (LID), 8) potentialinduced degradation (PID), [10][11][12] and so on. Soiling and unexpected failures at exposed sites have been summarized in reports from the National Renewable Energy Laboratory 13) and the International Energy Agency Photovoltaic Power Systems Programme.…”