The most popular method to determine the sensitivity of surface plasmon resonance sensors in the past couple of decades has been angular interrogation. The silver layer (Ag), a twoβdimensional layer of TiO2, dielectric material layer such as silicon (Si) with heterostructure material graphene is all stacked in the proposed surface plasmon resonance sensor. To increase sensitivity of SPR sensor in the visible area, the device structure focuses on the Kretschmann configuration, by which an TiO2 sheet is sandwiched between silver and silicon sheets. The proposed device structure makes use of the operational wavelength of 633 nm. The numerical simulation has been performed in MATLAB software in this device structure. The simulation results show that an analyte of refractive indices range 1.345 to 1.350. A single layer of silicon 3nm and TiO2 10nm make up the suggested SPR configuration, which increases the sensitivity to 281Β°/RIU. In this work, it has also been computed the figure of merit, detection accuracy, limit of detection, full width at half maximum, and TM electric field intensity. The biomedical and chemical fields have benefited from the proposed SPR sensor structure design.This article is protected by copyright. All rights reserved.