Self-testing of fully differential multistage circuits using common-mode excitation

Toczek, Wojciech

doi:10.1016/j.microrel.2008.09.007

Cited by 5 publications

(6 citation statements)

References 21 publications

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“…Equation (4), derived in [ 22 ], is a generalized Rayleigh distribution, adequate for the measured voltage magnitude, for which the real part and imaginary part are characterized by normal probability distributions with zero mean values and various standard deviations. Figure 1 shows the graph of the probability density function (4) for the given standard deviations:

= 14.8 mV,

= 18.6 mV, and correlation coefficient r = 0.…”

Section: Case Studymentioning

confidence: 99%

“…; σ α , σ β -standard deviations of the real and imaginary part of the voltage, respectively; r-correlation coefficient between the real and imaginary parts; σ αβ -covariance; I 0 -modified zero order Bessel function. Equation ( 4), derived in [22], is a generalized Rayleigh distribution, adequate for the measured voltage magnitude, for which the real part and imaginary part are characterized by normal probability distributions with zero mean values and various standard deviations. Figure 1 shows the graph of the probability density function (4) for the given standard deviations: σ α = 14.8 mV, σ β = 18.6 mV, and correlation coefficient r = 0. evaluated after 10 9 trials.…”

Section: Case Studymentioning

confidence: 99%

“…In work [ 22 ] authors implemented a probabilistic measurement model in the Matlab environment and used it to optimize a built-in self-tester for a fully differential electronic circuit. The model was used for setting test limits under production process deviations as a trade-off between defect level and yield loss.…”

Section: Introductionmentioning

confidence: 99%

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Risk Analysis by a Probabilistic Model of the Measurement Process

Toczek

Smulko

2021

Sensors

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The aim of the article is presentation of the testing methodology and results of examination the probabilistic model of the measurement process. The case study concerns the determination of the risk of an incorrect decision in the assessment of the compliance of products by measurement. Measurand is characterized by the generalized Rayleigh distribution. The model of the measurement process was tested in parallel mode by six risk metrics. An undesirable effect in the reconstruction building block of the model was detected, consisting in the distortion of probability distribution at the edges of the measuring range. The paper gives guidelines on how to use the model, to obtain the analytical risk assessment consistent with the results of the Monte Carlo method. The study can be useful in product quality control, test design, and fault diagnosis.

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= 14.8 mV,

= 18.6 mV, and correlation coefficient r = 0.…”

Section: Case Studymentioning

confidence: 99%

Section: Case Studymentioning

confidence: 99%

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Risk Analysis by a Probabilistic Model of the Measurement Process

Toczek

Smulko

2021

Sensors

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“…It is worth mentioning that the specialized BISTs for analog circuits, e.g. the oscillation OBISTs [8], histogram HBISTs [9], testers for fully differential circuits [10], TBISTs [11], and  type testers [12] have to be extended with additional circuits enabling them to communicate with the testing system. The JTAG BISTs are free from that shortcoming, since they are already equipped with the JTAG communication interface.…”

Section: Introductionmentioning

confidence: 99%

A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus

Czaja¹

2016

ELECTROTECHNICAL REVIEW

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A new solution of the JTAG BIST for testing analog circuits in mixed-signal electronic microsystems controlled by microcontrollers and equipped with the IEEE1149.1 bus is presented. It is based on a new fault diagnosis method in which an analog circuit is stimulated by a buffered signal from the TMS line, and the time response of the circuit to this signal is sampled by the ADC equipped with the JTAG. The method can be used for fault detection and single soft fault localization in an analog tested circuit (A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus). Streszczenie. Przedstawiono nowe rozwiązanie testera JTAG BIST przeznaczonego do testowania torów analogowych w mieszanych sygnałowo mikrosystemach elektronicznych sterowanych mikrokontrolerami i wyposażonych w magistralę testującą IEEE1149.1 (JTAG). Bazuje ona na nowej metodzie diagnostycznej, w której tor analogowy pobudzany jest buforowanym sygnałem z linii TMS, a odpowiedź czasowa tego toru na ten sygnał jest próbkowana przez przetwornik A/C wyposażony w interfejs JTAG. Metoda ta pozwala na detekcję i lokalizację pojedynczych uszkodzeń parametrycznych w analogowym układzie badanym (Metoda testowania części analogowych analogowo-cyfrowych systemów elektronicznych wyposażonych w magistralę testującą IEEE1149.1).

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“…The main direction of development of testing analog circuits in EESs is the built-in self-test (BIST) technique. In last years many specific solutions of BISTs dedicated for concrete circuits have been reported: oscillation-based BIST (OBIST) [1], digital reuse [2], histogram based [3], [4] dedicated for fully-differential stages [5], [6],  BIST [7], [8] and ADC BIST for AD converters. The common feature of these solutions is hardware excess, i.e.…”

Section: Introductionmentioning

confidence: 99%

Two-functional µBIST for Testing and Self-Diagnosis of Analog Circuits in Electronic Embedded Systems

Załęski

Zielonko

2014

ACTA IMEKO

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The paper concerns the testing of analog circuits and blocks in mixed-signal Electronic Embedded Systems (EESs), using the Built-in Self-Test (BIST) technique. An integrated, two-functional, embedded microtester (µBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the µBIST solution is its extended functionality. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing the Complementary Signals (CSs), and for fault diagnosis the Simulation Before Test (SBT) vocabulary techniques have been used. In the fault vocabulary the graphical signatures in the form of identification curves in multidimensional spaces have been applied.

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Self-testing of fully differential multistage circuits using common-mode excitation

Cited by 5 publications

References 21 publications

Risk Analysis by a Probabilistic Model of the Measurement Process

Risk Analysis by a Probabilistic Model of the Measurement Process

A testing method of analog parts of mixed-signal electronic systems equipped with the IEEE1149.1 test bus

Two-functional µBIST for Testing and Self-Diagnosis of Analog Circuits in Electronic Embedded Systems

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