Two-functional µBIST for Testing and Self-Diagnosis of Analog Circuits in Electronic Embedded Systems

Abstract

The paper concerns the testing of analog circuits and blocks in mixed-signal Electronic Embedded Systems (EESs), using the Built-in Self-Test (BIST) technique. An integrated, two-functional, embedded microtester (µBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the µBIST solution is its extended functionality. It can perform 2 testing functions: functional testing and fault diagnosis on the level of localization of a faulty element. For functional testing the Complementary Signals (CSs), and for fault diagnosis the Simulation Before Test (SBT) vocabulary techniques have been used. In the fault vocabulary the graphical signatures in the form of identification curves in multidimensional spaces have been applied.

Analysis of the RBF ANN-based classifier for the diagnostics of electronic circuit

“…Successful implementation of the presented diagnostic scheme to their analysis would confirm usefulness of the RBF ANN in the fault detection and identification task. Also, more sophisticated approaches should be developed for the selection of the accessible nodes, especially in complex systems [10] with many parameters to determine. Finally, parallel implementations of the OvO coding scheme would eliminate its main disadvantage i.e.…”

“…Their implementations in the diagnostics cover power lines [8] or electrical machines [9]. They are currently widely exploited and work as the standard diagnostic tool, or the self-diagnostic module [10]. Training the MLP classifier consists in selecting one of available algorithms (such as error backpropagation or Levenberg-Marquardt) and adjusting the available data to the predefined architecture.…”

Introductory notes for the Acta IMEKO Special Issue on "Technical Diagnostics : New Perspectives in Measurements, Tools and Techniques for Industrial Applications"

“…Several tests are also implemented in order to demonstrate robustness and sensitivity of the approach. In the field of testing for electronic devices an interesting contribution is proposed by D. Załęski and R. Zielonko in [2]. The paper concerns the testing of analog circuits and blocks in mixed-signal Electronic Embedded Systems (EESs) by means of the Built-in Self-Test (BIST) technique.…”