2022
DOI: 10.1109/tpel.2021.3131535
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Self-Sustained Turn-OFF Oscillation of Cascode GaN HEMTs: Occurrence Mechanism, Instability Analysis, and Oscillation Suppression

Abstract: This paper presents a comprehensive study on the occurrence mechanism, instability analysis and suppression methods of self-sustained turn-off oscillation which occurs on cascode gallium nitride high electron mobility transistors (cascode GaN HEMTs). In the beginning, the oscillation waveforms are analyzed, which indicate that the occurrence of the oscillation is determined by test circuit instability. Based on the double pulse test, the impact of the load current IL, DC-bus voltage VDC and gate resistance RG … Show more

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Cited by 15 publications
(10 citation statements)
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“…Self-sustained oscillation is observed during the turn-off transient. According to [8], the self-sustained oscillation occurs due to the instability of the test circuit. Due to the cascode configuration, a positive feedback mechanism can be triggered.…”
Section: Turn-off Oscillation Of Cascode Gan Hemtsmentioning
confidence: 99%
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“…Self-sustained oscillation is observed during the turn-off transient. According to [8], the self-sustained oscillation occurs due to the instability of the test circuit. Due to the cascode configuration, a positive feedback mechanism can be triggered.…”
Section: Turn-off Oscillation Of Cascode Gan Hemtsmentioning
confidence: 99%
“…Due to the cascode configuration, a positive feedback mechanism can be triggered. If the test circuit is unstable, the positive feedback action can draw additional energy from the power supply, which compensates for the power losses dissipated by the resistive components in the test circuit [8]. The oscillation is thereby able to maintain self-sustaining.…”
Section: Turn-off Oscillation Of Cascode Gan Hemtsmentioning
confidence: 99%
See 3 more Smart Citations