Self-referenced frequency response measurement of high-speed photodetectors through segmental up-conversion based on low-speed photonic sampling

Wang, Mengke; Zhang, Shangjian; He, Yutong; Liu, Zhao; Zhang, Xuyan; Wang, Heng; Ma, Yangxue; Sun, Biao; Zhang, Yali; Zhang, Zhiyao; Liu, Yong

doi:10.1364/oe.382798

Cited by 17 publications

(5 citation statements)

References 24 publications

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“…Recently, we proposed an ultra-wideband and frequency scalable electro-optic stimulus for self-referenced measurement of high-speed PDs through segmental up-conversion based on low-speed photonic sampling [52], with the help of a low-repetition-frequency mode-locked laser diode (MLLD), as shown in Fig. 9.…”

Section: O/e Device Measurementmentioning

confidence: 99%

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Accurate Calibration and Measurement of Optoelectronic Devices

Zhang

Chen

et al. 2021

J. Lightwave Technol.

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Frequency responses of optoelectronic devices are essential to obtain the precise performance of electrical-to-optical-to-electrical signal conversion or optical signal processing. We reviewed the development of optical or electrical measurement methods proposed for characterizing electrical/optical (E/O) devices, optical/electrical (O/E) devices and optical/optical (O/O) devices in the frequency domain from the perspective of accurate calibration standard. It has been found that full calibrated E/O or O/E measurement requires at least an optoelectronic thru standard for the conversion between optical and electrical domains, and an electrical port extension for de-embedding the error or adapter network of microwave source or detector. The indetermination problem still exists in most O/E and E/O device characterization, which appears in different forms for different measurement techniques. Nevertheless, it should be noticed that obtaining an optoelectronic thru standard can be transferred to characterizing a microwave source or detector in the electrical domain, and a precise electrical calibration standard is much easier to be obtained as compared with an optoelectronic calibration standard. Therefore, the calibration standard transfer from optical to electrical domain is a prominent approach to solve the indetermination problem.

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Section: O/e Device Measurementmentioning

confidence: 99%

“…Schematic diagram of the low-speed photonic sampling, MLLD: mode-locked laser diode, MOD: modulator, MS: microwave source, DUT: device under test, PD: photodetector, ESA: electrical spectrum analyzer[52].…”

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confidence: 99%

Accurate Calibration and Measurement of Optoelectronic Devices

Zhang

Chen

et al. 2021

J. Lightwave Technol.

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“…However, to extract the individual frequency response of the PD, a calibrated IM must be employed as an electrical/optical (E/O) transducer standard, and vice versa [2]. To simplify the E/O or O/E calibration procedure, many self-calibrated methods are proposed, such as the two-tone method [3], frequency-shifted heterodyne method [4], and the photonic sampling method [5]. Nevertheless, this method is only efficient for packaged photodetectors with a good impedance match.…”

Section: Introductionmentioning

confidence: 99%

Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Jing

Wang

et al. 2022

Semiconductor Lasers and Applications XII

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An improved self-reference photonic sampling method is proposed to measure the frequency response of photodiode (PD) chips. In the proposed scheme, the uneven response of the Mode-Locked Laser Source (MLLS) is eliminated by using the half-frequency photonic sampling measurements. The microwave de-embedding under short-open-load-device termination is used to realize on-chip de-embedding of the adapter network connected to the receiver of the microwave network analyzer in terms of the transmission loss and the impedance mismatch. The proposed on-chip measurement method is free of any extra electro-optical transducer standard, and an accurate measurement can still be realized without an impedance match.

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“…Particularly, achieving the fast and accurate frequency response measurement of PDs has become more and more important for the purpose of device evaluation and system optimization [3,4]. There are several methods proposed for measuring the frequency response of high-speed PDs based on all-optical stimulus [5,6], electro-optical frequency sweep (EOFS) [7,8] and photonic sampling [9]. The all-optical methods often use a tunable laser or an amplified spontaneous emission (ASE) source to achieve ultra-wideband measurement of highspeed PDs.…”

Section: Introductionmentioning

confidence: 99%

Self-calibrated frequency response measurement of photodetectors based on photonic sampling

Jing

Zhang

et al. 2022

Optoelectronic Devices and Integration XI

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A simple and novel method is proposed for the self-calibrated measurement of high-speed photodetectors (PDs) based on photonic sampling by using a mode-locked laser (MLL). Through the photonic sampling measurements, the uneven response of the MLL can be determined. The prominent advantage of the proposed method lies that the self-reference extraction of the frequency response of the PD can be achieve without the need of any extra electrical/optical transducer standard. In the experiment, a commercial PD is measured by using a MLL with the repetition frequency of 21.936 MHz. The measurement results fit in with the conventional electro-optic frequency sweep measurement.

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Self-referenced frequency response measurement of high-speed photodetectors through segmental up-conversion based on low-speed photonic sampling

Cited by 17 publications

References 24 publications

Accurate Calibration and Measurement of Optoelectronic Devices

Accurate Calibration and Measurement of Optoelectronic Devices

Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Self-calibrated frequency response measurement of photodetectors based on photonic sampling

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