2011 24th Internatioal Conference on VLSI Design 2011
DOI: 10.1109/vlsid.2011.68
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Self-Immunity Technique to Improve Register File Integrity Against Soft Errors

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Cited by 19 publications
(11 citation statements)
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“…As can be seen in Figure 6, the trapping-detrapping model (Equation 4) results in a 45% lower shift in V th than the reaction-diffusion model after one year.…”
Section: B Negative Bias Temperature Instabilitymentioning
confidence: 87%
See 1 more Smart Citation
“…As can be seen in Figure 6, the trapping-detrapping model (Equation 4) results in a 45% lower shift in V th than the reaction-diffusion model after one year.…”
Section: B Negative Bias Temperature Instabilitymentioning
confidence: 87%
“…Unlike faults induced by soft errors, where systems may correct them during runtime at a low cost [4], permanent faults are more dangerous as they cannot be easily treated and capable to negatively affect chip lifetime [7]. Additionally, excrescent temperatures are also responsible for generating timing errors as an increase of 10 • C may increase interconnect delay by around 5% [16].…”
Section: Introductionmentioning
confidence: 99%
“…For embedded (in-order) cores, some prior work focuses on pure hardware solutions [Blom et al 2006;Fazeli et al 2010;Amrouch and Henkel 2011;Hu et al 2009b]. Blom et al [2006] and Fazeli et al [2010] proposed register caching mechanisms to only protect the cached registers either by SEU-tolerant latches [Fazeli et al 2010] or Cyclic Redundancy Check (CRC) [Blom et al 2006].…”
Section: Hw-onlymentioning
confidence: 99%
“…Blom et al [2006] and Fazeli et al [2010] proposed register caching mechanisms to only protect the cached registers either by SEU-tolerant latches [Fazeli et al 2010] or Cyclic Redundancy Check (CRC) [Blom et al 2006]. Other approaches protect narrow bits values either by storing ECC codes [Amrouch and Henkel 2011] or duplicating the content of lower-half word to higher-half [Hu et al 2009b]. These approaches are restricted to limited data range and are constrained by high power overhead of ECC checking logic.…”
Section: Hw-onlymentioning
confidence: 99%
“…The reason is that most data in registers cannot cover all 32 bits [18]. Therefore, the highest order bit is most sensitive to NBTI effect.…”
Section: Qb (Mv) Q (Mv)mentioning
confidence: 99%