Transient creep tests are performed under constant stress conditions at temperatures ranging from 373 to 453 K for Sn‐0.5 wt% Zn, Sn‐9 wt% Zn, and Pb‐10 wt% Sn, and from 363 to 433 K for Pb‐61.9 wt% Sn samples. The transient creep is described by ϵtr = Btn, where ϵtr and t are the transient creep strain and time. The parameters B and n are calculated. The activation enthalpy of the transient creep shows for each alloy two regions at low and high temperatures. The values of activation enthalpies show that the mechanism controlling transient creep in Sn‐Zn alloys is a dislocation mechanism, while in Pb‐Sn alloys it consists of dislocation intersections and grain boundary diffusion.