“…This result is similar to that estimated by QCM measurement (36 nm). The AFM image showed the film roughness to be 3.7 nm (horizontal distance between measurement points: 6.0 m), which is less than that of amorphous TiO 2 thin film (RMS 9.7 nm, 27 nm thick, horizontal distance between measurement points: 6.0 m)) 34 . Additionally, the roughness of the octadecyl group regions was shown to be 0.63 nm (horizontal distance between measurement points: 1.8 m) 39 .…”