2001
DOI: 10.1016/s0040-6090(00)01761-2
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Selective deposition and micropatterning of titanium dioxide thin film on self-assembled monolayers

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Cited by 105 publications
(127 citation statements)
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“…This result is similar to that estimated by QCM measurement (36 nm). The AFM image showed the film roughness to be 3.7 nm (horizontal distance between measurement points: 6.0 m), which is less than that of amorphous TiO 2 thin film (RMS 9.7 nm, 27 nm thick, horizontal distance between measurement points: 6.0 m)) 34 . Additionally, the roughness of the octadecyl group regions was shown to be 0.63 nm (horizontal distance between measurement points: 1.8 m) 39 .…”
Section: 3mentioning
confidence: 85%
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“…This result is similar to that estimated by QCM measurement (36 nm). The AFM image showed the film roughness to be 3.7 nm (horizontal distance between measurement points: 6.0 m), which is less than that of amorphous TiO 2 thin film (RMS 9.7 nm, 27 nm thick, horizontal distance between measurement points: 6.0 m)) 34 . Additionally, the roughness of the octadecyl group regions was shown to be 0.63 nm (horizontal distance between measurement points: 1.8 m) 39 .…”
Section: 3mentioning
confidence: 85%
“…5(3-a,b)). The center of the anatase TiO 2 t hin film reg io n was 61 nm hig her than the octadecyl regions, and the thickness of the anatase TiO 2 thin film was estimated to be 36 nm considering the thickness of amorphous TiO 2 thin film (27 nm) 34 and OTS molecules (2.4 nm) 39 . This result is similar to that estimated by QCM measurement (36 nm).…”
Section: 3mentioning
confidence: 99%
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