Selective compression technique using Variable-to-Fixed coding

Abstract

Inthis paper, we propose a code based technique, Variable-to-Fixed (V -F) coding, for power efficient test data compression. The proposed scheme with the aim of achieving high compression ratio and low power consumption relies on reducing, the number of bits for representing the original test vector and the number of transitions per second. Simulation results on ISCAS'89 benchmark circuits, demonstrate that this optimization methodology helps achieve reduced test data volume than previous schemes for cases where the number of specified bits in the test set is relatively few.

New scan compression approach to reduce the test data volume

“…The 'NSC' also reduces TAT as patterns count reduction results in a reduction in TAT. If ChL is the scan configuration chain length, the compression chain length is ChL/100, and with Tp is the number of test patterns, then the TAT is calculated as shown in Equation (7). The proposed 'NSC' architecture exploited the advantages of the full scan chain and scan compression technique.…”

“…Fixed-to-variable based selective Huffman coding scan compression architecture is proposed in [4] to reduce the TDV with an area overhead in the range of 2.9% to 17.1%. The various code-based schemes are proposed in [5][6][7][8]. The code-based test compression methods are usually inefficient in TAT reduction [25] and require complex control logic [9].…”