Abstract:The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompressible values logic‐0 and logic‐1 in many or most of the patterns contribute to the TDV. In the proposed new scan compression (NSC) architecture, SFFs are analysed from Automatic Test Pattern Generation (ATPG) patterns generat… Show more
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