2021
DOI: 10.1039/d1na00221j
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Selective area growth of GaN nanowires and nanofins by molecular beam epitaxy on heteroepitaxial diamond (001) substrates

Abstract: GaN-on-diamond is a promising route towards reliable high-power transistor devices with outstanding performances due to a better heat management replacing common GaN-on-SiC technologies. Nevertheless, the implementation of GaN-on-diamond remains challenging....

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Cited by 7 publications
(6 citation statements)
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References 60 publications
(111 reference statements)
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“…The growth duration was 90 min. A detailed description of the NS fabrication process can be found in the literature [25][26][27][28]. The background pressure of the MBE system was in the 10 −10 mbar range.…”
Section: Methodsmentioning
confidence: 99%
“…The growth duration was 90 min. A detailed description of the NS fabrication process can be found in the literature [25][26][27][28]. The background pressure of the MBE system was in the 10 −10 mbar range.…”
Section: Methodsmentioning
confidence: 99%
“…With careful optimization of our growth process, we develop nanostructures with dimensions <300 nm and ultra-smooth sidewalls. Hence, SAE-grown three-dimensional GaN nanostructures - wires, fins, rings, and curved features enable the fabrication of a wider range of electronic and photonic devices, such as fin field-effect transistors, lasers, and light-emitting diodes (LEDs). ,,, …”
Section: Introductionmentioning
confidence: 99%
“…Selective area epitaxy (SAE) , is a viable alternative to precisely control the size, position, shape, and density with an added advantage of controllability on III-nitride crystal planes, such as polar, semipolar and nonpolar facets of nanostructures. The powerful SAE technique yields various types of nanostructures ranging from nanowires (NWs), nanofins (NFs), and nanorings (NRs). Until recently, it has remained challenging to understand the SAE kinetics and selectively grow nanostructures using different mask materials.…”
Section: Introductionmentioning
confidence: 99%
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“…Prior to growth, the Ti masks were nitridated at 400 °C for 10 min and at 800 °C for 5 min with a nitrogen flux of 0.363 sccm and an RF power of 425 W to convert the Ti mask to the more stable TiNx. A more detailed description is provided in previous publications. Growth of GaN NWs was carried out at substrate temperatures between 875 and 955 °C under nitrogen-rich growth conditions at a Ga flux of 1.0 × 10 –6 mbar beam equivalent pressure (BEP) for 90 min while maintaining the nitrogen flux. GaN NWs were grown on a GaN template on c -plane sapphire (Saint-Gobain Lumilog) for further analysis by TEM, while NWs used for Raman measurements were grown on a Si(111) substrate.…”
mentioning
confidence: 99%