Selected contactless optoelectronic measurements for electronic applications (invited)

Cutolo, A.

doi:10.1063/1.1148752

Cited by 17 publications

(7 citation statements)

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“…Good references explaining different thermal measurement techniques are Kolzer [1],Altet [2] and Cutolo [3]. Such methods can rely on coatings, mechanical contact, optical surface effects or even integrating thermal sensors into the device.…”

Section: Introductionmentioning

confidence: 99%

Microscale and Nanoscale Thermal Characterization Techniques

Christofferson

Maize

Ezzahri

et al. 2007

2007 International Conference on Thermal Issues in Emerging Technologies: Theory and Application

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Miniaturization of electronic and optoelectronic devices and circuits and increasedswitching speeds have exasperated localized heating problems. Steady-state and transient characterization of temperature distribution in devices and interconnects is important for performance and reliability analysis. Novel devices based on nanowires, carbon nanotubes and single molecules have feature sizes in 1-100nm range and precise temperature measurement and calibration are particularly challenging. In this paper we review various microscale and nanoscale thermal characterization techniques that could be applied to active and passive devices. Solid-state micro refrigerators on a chip can provide a uniform and localized temperature profile and they are used as a test vehicle in order to compare the resolution limits of various microscale techniques. After a brief introduction to conventional micro thermocouples and thermistor sensors, various contact and contactless techniques will be reviewed. Infrared microscopy is based on thermal emission and it is a convenient technique that could be used with features tens of microns in size. Resolution limits due to low emissivity and transparency of various materials and issues related to background radiation will be discussed. Liquid crystals that change color due to phase transition have been widely used for hot spot identification in integrated circuit chips. The main problems are related to calibration and aging of the material. Micro Raman is an optical method that can be used to measure absolute temperature. Micron spatial resolution with several degrees temperature resolution has been achieved. Thermoreflectance technique is based on the change of the sample reflection coefficient as a function of temperature. This small change in 10 -4 -10 -5 range per degree is typically detected using lock-in technique when the temperature of the device is cycled. Use of visible and near IR wavelength allows both top surface and through the substrate measurement. Both single point measurements using a scanning laser and imaging with CCD or specialized lock-in cameras have been demonstrated. For ultrafast thermal decay measurement, pump-probe technique using nanosecond or femtosecond lasers have been demonstrated. This is typically used to measure thin film thermal diffusivity and thermal interface resistance. The spatial resolution of various optical techniques can be improved with the use of tapered fibers and near field scanning microscopy. While sub diffraction limit structures have been detected, strong attenuation of the signal reducesthe temperature resolution significantly. Scanning thermal microscopy which is based on nanoscale thermocouples at the tip of atomic force microscope has had success in ultra high spatial resolution thermal mapping. Issues related to thermal resistance between the tip and the sample and parasitic heat transfer paths will be discussed.

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Section: Introductionmentioning

confidence: 99%

Microscale and Nanoscale Thermal Characterization Techniques

Christofferson

Maize

Ezzahri

et al. 2007

2007 International Conference on Thermal Issues in Emerging Technologies: Theory and Application

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“…Review of different thermal measurement techniques was presented by Christofferson [1], Kolzer [2], Altet [3] and Cutolo [4]. Such techniques can be distinguished based on their operating mode: contact mode versus non-contact mode.…”

Section: Topical Reviewmentioning

confidence: 99%

Thermoreflectance spectroscopy—Analysis of thermal processes in semiconductor lasers

Pierścińska

2017

J. Phys. D: Appl. Phys.

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This review focuses on theoretical foundations, experimental implementation and an overview of experimental results of the thermoreflectance spectroscopy as a powerful technique for temperature monitoring and analysis of thermal processes in semiconductor lasers. This is an optical, non-contact, high spatial resolution technique providing high temperature resolution and mapping capabilities. Thermoreflectance is a thermometric technique based on measuring of relative change of reflectivity of the surface of laser facet, which provides thermal images useful in hot spot detection and reliability studies. In this paper, principles and experimental implementation of the technique as a thermography tool is discussed. Some exemplary applications of TR to various types of lasers are presented, proving that thermoreflectance technique provides new insight into heat management problems in semiconductor lasers and in particular, that it allows studying thermal degradation processes occurring at laser facets. Additionally, thermal processes and basic mechanisms of degradation of the semiconductor laser are discussed.

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“…These involve 1) electromagnetic; 2) magnetic; 3) thermal; and 4) acoustic measurements [12]. We also mention the concept of built-in self-test systems [9].…”

Section: Transistor-level Diagnostics and Test In Twenty-first Cementioning

confidence: 99%