Time-resolved optical characterization of electrical activity in integrated circuits

Tsang, J. C.; Kash, J. A.; Vallett, D.P.

doi:10.1109/5.883316

Cited by 25 publications

(5 citation statements)

References 42 publications

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“…In the last years, new testing techniques have been introduced for optically accessing active devices within ICs from the backside of the wafer [3,4]. In particular, Picosecond Imaging Circuit Analysis (PICA) [3] is a very powerful tool for identifying switching transitions and measuring propagation delays and skews by means of the hot-carrier luminescence emitted by CMOS transistors in saturation.…”

Section: Non-invasive Testingmentioning

confidence: 99%

CMOS Circuit Analysis with Luminescence Measurements and Simulations

Stellari

Tosi

Zappa

et al. 2002

32nd European Solid-State Device Research Conference

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Hot-carriers in MOSFETs are responsible for timedependent near-infrared emission, synchronous with the switching transitions in CMOS circuits. Fast electrical waveforms propagating through integrated circuits can be effectively measured by means of high sensitivity solid-state photodetectors with sharp time-resolution. Thanks to a time jitter of less than 30ps, we obtained an equivalent analog bandwidth of about 30GHz. We developed a photoemission model in SPICE in order to simulate the luminescence waveforms. By comparing measured and simulated optical waveforms, in-depth insight of circuit behavior is reported, leading to a powerful identification of defects and failures.

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Section: Non-invasive Testingmentioning

confidence: 99%

CMOS Circuit Analysis with Luminescence Measurements and Simulations

Stellari

Tosi

Zappa

et al. 2002

32nd European Solid-State Device Research Conference

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“…Recent reports relating to the monolithic fabrication of photo detectors, modulators and emitters on Si have given rise to the exciting prospect of combining optoelectronics and GSI in a highvolume manufacturing environment [8]. In fact, the domain which involves measuring the electrical quantity such as voltage or current, using optical methods is adopted to perform testing modern integrated circuits [9]. The technology that uses electrooptic (EO) probing of electrical circuits with laser beam is developed by several research teams [10].…”

Section: Introductionmentioning

confidence: 99%

Remote online testing of embedded systems using Optical BILBO

Latoui

Canals

2014

2014 14th Biennial Baltic Electronic Conference (BEC)

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In this paper, an online testing approach that checks continuously at remote system the correctness of embedded systems in full operation is proposed. Our new method exploits optical beams produced by an Optical Built-In Logic-Block Observation (OBILBO) register based on the captured data presented on the outputs of all stages of the registers in the BILBO. Then it is possible to send the captured data to remote system equipped with optical sensors in real time way. The final captured response data can also be used for final comparison with stored data of a golden circuit. Preliminary simulation results showed that faults are concurrently detected without affecting normal system operation and without having recourse to any external or internal Automatic Test Pattern Generation (ATPG).

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“…When the device is analyzed with contactless optical tools like dynamic light emission [2,3] or electro-optical probing [4,5], for example, the operator relies on NIR (Near Infrared) backside imaging of the circuit to navigate on it. For various reasons, the signal acquired by the optical sensor can be of poor quality.…”

Section: Introductionmentioning

confidence: 99%