Time-of-flight secondary ion mass spectrometry (ToF SIMS) has been
applied in conjunction
with isotope enrichment to investigate the chemical composition of the
surface species of
poly(acrylonitrile)-based carbon fibers, which were
electrolytically oxidized in dilute
hydrochloric acid solution in water with
17O/18O enrichment. The technique provides
a tool
with greater specificity and sensitivity to elemental species than
X-ray photoelectron
spectroscopy (XPS), in which the effects of the presence of the heavier
isotopes on the
modification to surface chemistry cannot be detected. Peaks
associated with oxygen-containing functionalities, for example,
m/z = 16 (O-), 17
(17O-, OH-), 18
(18O-,17OH-),
and
19 (18OH-) were identified in negative
ToF SIMS spectra of carbon fibers treated in isotope
enriched solution. Only m/z = 16
(O-), 17 (17O-,
OH-) were identified on carbon fiber
surfaces
treated in normal water. The concentrations of these surface
species all showed an increasing
trend with the level of treatment. The use of HCl solution as the
electrolyte introduced Cl-
onto the fiber surfaces, and its concentration was determined using
both XPS and SIMS,
with SIMS showing a much improved sensitivity when the surface
concentration is lower
than 0.5 atom %.