Secondary ion emission from beryllium surfaces by Ar and /or (Ar+D2) mixed ion bombardments

Ashida, Kan; Matsuyama, Masao; Watanabe, Kuniaki; Kawamura, Hiroshi; Ishitsuka, Etsuo

doi:10.1016/0022-3115(94)90176-7

Cited by 8 publications

(1 citation statement)

References 22 publications

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“…This could favor the formation of Be x O y D z molecules in our MD simulations that appear mostly as BeO dimer and BeOD molecules. However, BeO, BeOD and BeO 2 molecules have been observed experimentally by mass spectrometry after the bombardment of Be samples by an (Ar + +D + 2 ) mixture [33]. Thus, their formation in our MD simulations is not an artifact of the potential.…”

Section: Sputtering Of Be X O Y D Z Moleculesmentioning

confidence: 71%

Sputtering of beryllium oxide by deuterium at various temperatures simulated with molecular dynamics

Hodille¹,

Byggmästar²,

Safi³

et al. 2020

Phys. Scr.

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The sputtering yield of beryllium oxide (BeO) by incident deuterium (D) ions, for energies from 10 eV to 200 eV, has been calculated for temperatures between 300 K and 800 K using classical molecular dynamics. First, cumulative irradiations are done to build up a concentration of D in the material, equal to the one experimentally measured, that varies from 0.12 atomic fraction (300 K -500 K) to 0.02 atomic fraction (800 K). After building up the concentration of D, non-cumulative irradiations are done to estimate the sputtering yields of BeO. For all incident energies, the sputtering yield peaks at 500 K, being closely related to the decrease of the concentration of D above this temperature. While for 10 eV, the concentration of D on the surface drives the temperature dependence, above 30 eV, it is the amount of surface damage created during the cumulative irradiation.

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Section: Sputtering Of Be X O Y D Z Moleculesmentioning

confidence: 71%