1989
DOI: 10.1016/0168-1176(89)83028-9
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Secondary electron emission induced by impact of low-velocity molecular ions on a microchannel plate

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Cited by 100 publications
(78 citation statements)
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“…The last type of correction involves the m/z bias of the microchannel plate (MCP) detector. The efficiency with which an ion generates a secondary electron in the MCP has been shown to vary as follows [32][33][34]:…”
Section: Mass Spectrometry and Data Analysismentioning
confidence: 99%
“…The last type of correction involves the m/z bias of the microchannel plate (MCP) detector. The efficiency with which an ion generates a secondary electron in the MCP has been shown to vary as follows [32][33][34]:…”
Section: Mass Spectrometry and Data Analysismentioning
confidence: 99%
“…2. The drift length to the junction, operated in a 4 He cryostat at 1.4 K, was 173 cm, and to the MCP, mounted off-axis, was 122 cm. The sample was human serum albumin (HSA, mass 66 000 u) with a sinapinic acid matrix.…”
Section: Recent Demonstrations Of Superconducting Detectors Coupled Tmentioning
confidence: 99%
“…Cryostats, both 4 He (operating temperature down to 1.2 K) and 3 He (down to 0.3 K), with side access are available commercially from a number of firms. The most suitable type is similar to the 3 He system initially designed for infrared studies.…”
Section: Practicalitiesmentioning
confidence: 99%
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“…Further, by distributing ion flux across a number of discrete detectors, pulse pile-up issues often troublesome in TOFMS are alleviated. In addition, the possible incorporation of discrete charge-detector arrays [8,9] offers substantial dynamic range improvements over state-of-the-art TOFMS detector technology, while also reducing mass bias inherent to current TOFMS detection [10,11]. In both DOFMS and TOFMS ions arrive at the detectors intermittently as ion bunches are accelerated out of the source region.…”
mentioning
confidence: 99%