Secondary electron emission from thin ferroelectric, semiconducting, ht-superconducting layers (model and methodical possibilities)

Tomashpolsky, Yu. Ya.

doi:10.1080/00150199308008648

Cited by 4 publications

(3 citation statements)

References 4 publications

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“…5 ( Table 2) can be explained as a result of the electron irradiation-induced appearance of new phases and oxygen losses that modify the original composition. According to theoretical models [21] a higher SEE yield is expected from insulating and semiconducting phases as compared with the yield from the parent superconductor material.…”

Section: Discussionsupporting

confidence: 88%

Cathodoluminescence Microscopy and Secondary Electron Emission in Mechanically Polished and Electron Irradiated YBa2Cu3O7−x Ceramics

Dı́az-Guerra

Piqueras

Tomashpolsky

et al. 1996

Phys. Stat. Sol. (a)

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Cathodoluminescence (CL) and secondary electron emission (SEE) in the scanning electron microscope have been used to study the effects of mechanical polishing and electron irradiation on YBa2Cu3O7‐x ceramics. CL spectra from the mechanically polished superconductors show an enhanced 2.4 eV luminescence band, which is related to oxygen content redistribution or depletion. Electron irradiation induces strong morphological and compositional changes which are proposed to be connected with melting‐resolidification processes and surface phase segregation. SEE yield measurements allow to detect an oxygen depleted area with stoichiometric cationic composition surrounding the irradiated region. CL spectra recorded from this oxygen‐deficient area also show an enhanced 2.3 to 2.4 eV emission band in comparison with the spectra recorded from the non‐irradiated material. Strongly luminescent non‐superconducting phases appear in the irradiated regions, showing intense 3.1 and 0·78 to 0·81 eV emission bands.

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Section: Discussionsupporting

confidence: 88%

Cathodoluminescence Microscopy and Secondary Electron Emission in Mechanically Polished and Electron Irradiated YBa2Cu3O7−x Ceramics

Dı́az-Guerra

Piqueras

Tomashpolsky

et al. 1996

Phys. Stat. Sol. (a)

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“…We consider the basic formula describing the SEE yield [16] = βnλBe −λ/L where β is the inelastic scattering cross-section of secondary electrons at primary electrons, n the concentration of free carriers, λ the escape depth for secondary electrons (SEs) and L its mean free path. B represents the probability of the SEs overcoming the surface barrier, while βnλ describes the SE generation.…”

Section: Discussionmentioning

confidence: 99%

“…In the present work the effect of electron irradiation on Tl 2 Ba 2 CuO 6+δ samples has been investigated in the SEM by using CL microscopy, energy dispersive xray microanalysis (EDX) and secondary-electron emission (SEE). SEE has been used in recent years in phase analysis on the grain scale, in the determination of oxygen content, and in the detection of phase transitions in YBCO and BSCCO ceramics and single crystals [15][16][17][18]. The exponential dependence of the SEE yield on the oxygen concentration explains the high sensitivity of this technique in the local determination of oxygen deficiency.…”

Section: Introductionmentioning

confidence: 99%

Electron beam induced compositional and structural changes in

Dı́az-Guerra

Piqueras

Tomashpolsky

et al. 1996

Supercond. Sci. Technol.

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Tl 2 Ba 2 CuO 6+δ ceramics have been irradiated in a scanning electron microscope. The resultant changes in the cationic stoichiometry and oxygen content of the samples were investigated by cathodoluminescence (CL), secondary electron emission (SEE) and EDX microanalysis. Tl depletion and Ba enrichment are observed in the irradiated areas. CL spectroscopy shows that irradiation causes the increase of a 540 nm emission band attributed to complex centres involving oxygen vacancies. Other features of the CL spectra strongly suggest the presence of radiation induced new phases. The SEE yield, , has been found to depend on the oxygen content of the samples. This dependence can be explained on the basis of two charge carrier subsystems and their mutual interaction. Measurements of allow us to detect an oxygen deficient region, sometimes extending up to a distance of about 1000 µm, that surrounds the irradiated material.

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Secondary electron emissiometry of phase transitions in ferroelectrics and superconductors

Tomashpolsky

Sadovskaya

1995

Ferroelectrics

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Secondary electron emission from thin ferroelectric, semiconducting, ht-superconducting layers (model and methodical possibilities)

Cited by 4 publications

References 4 publications

Cathodoluminescence Microscopy and Secondary Electron Emission in Mechanically Polished and Electron Irradiated YBa2Cu3O7−x Ceramics

Cathodoluminescence Microscopy and Secondary Electron Emission in Mechanically Polished and Electron Irradiated YBa2Cu3O7−x Ceramics

Electron beam induced compositional and structural changes in

Secondary electron emissiometry of phase transitions in ferroelectrics and superconductors

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