The observation of the electro-optic effect in strained silicon waveguides has been considered as a direct manifestation of an induced χ (2) non-linearity in the material. In this work, we perform high frequency measurements on strained silicon racetrack resonators. Strain is controlled by a mechanical deformation of the waveguide. It is shown that any optical modulation vanishes independently of the applied strain when the applied voltage varies much faster than the carrier effective lifetime, and that the DC modulation is also largely independent of the applied strain. This demonstrates that plasma carrier dispersion is responsible for the observed electro-optic effect. After normalizing out free carrier effects, our results set an upper limit of 8 pm/V to the induced high-speed χ (2) eff,zzz tensor element at an applied stress of −0.5 GP a. This upper limit is about one order of magnitude lower than the previously reported values for static electro-optic measurements.In the last years, a lot of effort was spent investigating the strain induced second order nonlinearity (χ (2) effect) in Silicon by investigating the induced Pockels effect [1][2][3][4][5]. Strain induced χ (2) could be instrumental to make ultrafast and energy efficient electro-optic modulators for the Silicon photonics platform which would replace present electro-optic modulators based on the plasma dispersion effect [6][7][8][9]. More generally, the presence of an appreciable χ(2) in Silicon would validate the Silicon-on-Insulator (SOI) platform as an alternative to Lithium Niobate for second order nonlinear optics [10,11]. In most of these works, the centro-symmetry of Silicon is broken by a stressing film of Silicon Nitride which induces strain in the underlying Silicon waveguide and enables a χ (2) = 0 -at least from a first principle point of view [12]. With the exception of refs. [10,11], the Pockels effect was investigated by using an integrated imbalanced Mach-Zehnder interferometer in which one or both interferometer arms are driven by a DC or a low frequency (≈ kHz) AC electric field [1][2][3][4][5]. Then, an effective χ (2) mat value is extracted from the measured shift of the interference fringes by taking into account the system geometry and the magnitude of the applied static electric field. As expected from theory, the relation between the effective index change and the applied static electric field is found to be linear. The linear relation between these two physical quantities is considered as the evidence of the observation of a Pockels effect. Unfortunately, a linear effective index variation of the optical mode of a waveguide can also be induced by free carriers [13,14] or by trap states and localized charges at the SiN x -Si interface [11,13]. A definitive proof of the strain induced non-linearity can be obtained by high frequency measurements in an interferometer structure since the Pockels effect and the free carrier dispersion are characterized by two different characteristic times. In this letter, we measure the separa...