2017
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Schottky‐Barrier‐Controllable Graphene Electrode to Boost Rectification in Organic Vertical P–N Junction Photodiodes
Abstract: Monolayer graphene is used as an electrode to develop novel electronic device architectures that exploit the unique, atomically thin structure of the material with a low density of states at its charge neutrality point. For example, a single semiconductor layer stacked onto graphene can provide a semiconductor-electrode junction with a tunable injection barrier, which is the basis for a primitive transistor architecture known as the Schottky barrier field-effect transistor. This work demonstrates the next leve… Show more
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Cited by 44 publications
(65 citation statements)
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Abstract
Smart CitationsHow this paper cites the one you are viewing
“…This is attributed to the fact that the photon energy is higher than the optical bandgap of both Ga 2 O 3 and GaN layers; in other words, the absorption fraction is dominated by β-Ga 2 O 3 in the layer between 200 to around 256 nm. Where GaN governs the absorption above 363 nm, these outcomes are in well accordance with literature [32,46,52].…”
Section: Results and Investigation
supporting
confidence: 90%
“…By varying the concentration of donors at Ga 2 O 3 , it can be observed that at reverse bias -2 to 0 V lower doping leads to a wider depletion region; this creates a high volume where the photogenerated carriers are stored. The built-in voltage, which improves the current density at the reverse state, could influence those charge carriers [43,46]. For instance, for 3 × 10 16 and.…”
Section: Results and Investigation
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…This is attributed to the fact that the photon energy is higher than the optical bandgap of both Ga 2 O 3 and GaN layers; in other words, the absorption fraction is dominated by β-Ga 2 O 3 in the layer between 200 to around 256 nm. Where GaN governs the absorption above 363 nm, these outcomes are in well accordance with literature [32,46,52].…”
Section: Results and Investigation
supporting
confidence: 90%
“…By varying the concentration of donors at Ga 2 O 3 , it can be observed that at reverse bias -2 to 0 V lower doping leads to a wider depletion region; this creates a high volume where the photogenerated carriers are stored. The built-in voltage, which improves the current density at the reverse state, could influence those charge carriers [43,46]. For instance, for 3 × 10 16 and.…”
Section: Results and Investigation
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…8 The result n 1 > n 2 indicates a less ideal Gr/P5 interface than the P5/C-AFM tip one, and it can be related to more defects, impurities at the Gr/P5 interface. Although this parameter was not systematically reported in previous works on Gr/P5 Schottky diodes, 14,21,24,25 we note that the present value is better than ≈3 reported for HOPG/P5 diodes. 21 More interesting, we systematically obtained higher energy barriers for sample B than sample A: ε 1 > Φ B1 and ε 2 > Φ B2 (see Table 2 and 3).…”
Section: Needle-like Pentacene/graphene Devices
contrasting
confidence: 73%
Smart CitationsHow this paper cites the one you are viewing
“…The LUMO level of PTCDI-C 8 is approximately 4.3 eV. 19 Due to the gatetunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on-and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface. Interestingly, only the off-current density was significantly restrained, whereas the on-current density of the device was slightly enhanced from 0.73 to 0.79 mA/cm 2 .…”
Section: Results
mentioning
confidence: 99%
“…The work function of the rGO electrode was estimated to be 5.3 eV using photoelectron yield spectroscopy (Figure S2). The LUMO level of PTCDI-C 8 is approximately 4.3 eV . Due to the gate-tunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on- and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface.…”
Section: Results
and Discussion
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…This is attributed to the fact that the photon energy is higher than the optical bandgap of both Ga 2 O 3 and GaN layers; in other words, the absorption fraction is dominated by β-Ga 2 O 3 in the layer between 200 to around 256 nm. Where GaN governs the absorption above 363 nm, these outcomes are in well accordance with literature [32,46,52].…”
Section: Results and Investigation
supporting
confidence: 90%
“…By varying the concentration of donors at Ga 2 O 3 , it can be observed that at reverse bias -2 to 0 V lower doping leads to a wider depletion region; this creates a high volume where the photogenerated carriers are stored. The built-in voltage, which improves the current density at the reverse state, could influence those charge carriers [43,46]. For instance, for 3 × 10 16 and.…”
Section: Results and Investigation
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…8 The result n 1 > n 2 indicates a less ideal Gr/P5 interface than the P5/C-AFM tip one, and it can be related to more defects, impurities at the Gr/P5 interface. Although this parameter was not systematically reported in previous works on Gr/P5 Schottky diodes, 14,21,24,25 we note that the present value is better than ≈3 reported for HOPG/P5 diodes. 21 More interesting, we systematically obtained higher energy barriers for sample B than sample A: ε 1 > Φ B1 and ε 2 > Φ B2 (see Table 2 and 3).…”
Section: Needle-like Pentacene/graphene Devices
contrasting
confidence: 73%
Smart CitationsHow this paper cites the one you are viewing
“…The LUMO level of PTCDI-C 8 is approximately 4.3 eV. 19 Due to the gatetunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on-and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface. Interestingly, only the off-current density was significantly restrained, whereas the on-current density of the device was slightly enhanced from 0.73 to 0.79 mA/cm 2 .…”
Section: Results
mentioning
confidence: 99%
“…The work function of the rGO electrode was estimated to be 5.3 eV using photoelectron yield spectroscopy (Figure S2). The LUMO level of PTCDI-C 8 is approximately 4.3 eV . Due to the gate-tunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on- and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface.…”
Section: Results
and Discussion
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…This is attributed to the fact that the photon energy is higher than the optical bandgap of both Ga 2 O 3 and GaN layers; in other words, the absorption fraction is dominated by β-Ga 2 O 3 in the layer between 200 to around 256 nm. Where GaN governs the absorption above 363 nm, these outcomes are in well accordance with literature [32,46,52].…”
Section: Results and Investigation
supporting
confidence: 90%
“…By varying the concentration of donors at Ga 2 O 3 , it can be observed that at reverse bias -2 to 0 V lower doping leads to a wider depletion region; this creates a high volume where the photogenerated carriers are stored. The built-in voltage, which improves the current density at the reverse state, could influence those charge carriers [43,46]. For instance, for 3 × 10 16 and.…”
Section: Results and Investigation
mentioning
confidence: 99%
Abstract
Smart CitationsHow this paper cites the one you are viewing
“…8 The result n 1 > n 2 indicates a less ideal Gr/P5 interface than the P5/C-AFM tip one, and it can be related to more defects, impurities at the Gr/P5 interface. Although this parameter was not systematically reported in previous works on Gr/P5 Schottky diodes, 14,21,24,25 we note that the present value is better than ≈3 reported for HOPG/P5 diodes. 21 More interesting, we systematically obtained higher energy barriers for sample B than sample A: ε 1 > Φ B1 and ε 2 > Φ B2 (see Table 2 and 3).…”
Section: Needle-like Pentacene/graphene Devices
contrasting
confidence: 73%
Smart CitationsHow this paper cites the one you are viewing
“…The LUMO level of PTCDI-C 8 is approximately 4.3 eV. 19 Due to the gatetunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on-and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface. Interestingly, only the off-current density was significantly restrained, whereas the on-current density of the device was slightly enhanced from 0.73 to 0.79 mA/cm 2 .…”
Section: Results
mentioning
confidence: 99%
“…The work function of the rGO electrode was estimated to be 5.3 eV using photoelectron yield spectroscopy (Figure S2). The LUMO level of PTCDI-C 8 is approximately 4.3 eV . Due to the gate-tunable injection barrier height at the rGO/PTCDI-C 8 interface, I D could be effectively modulated under different V G at V D > 0 V. When an ultrathin CuPc interfacial layer was applied, the higher LUMO level (3.5 eV) of CuPc was expected to limit both the on- and off-current densities of the device because of the intrinsically larger injection barrier height at the rGO/CuPc interface.…”
Section: Results
and Discussion
mentioning
confidence: 99%
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