Scattering of light from a rough dielectric film on a reflecting substrate: diffuse fringes

Lu, Jun Q.; Sánchez‐Gil, José A.; Mendez, Eugenio Rafael Mendez; Gu, Zu-Han; Maradudin, A. A.

doi:10.1364/josaa.15.000185

Cited by 20 publications

(20 citation statements)

References 16 publications

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“…12, the satellite peaks disappear for all the polarization, but we see a new phenomenon called the Selényi fringes. 27,29,30 . For a slightly random rough surface, the slab produces fringes similar to those obtain with a Fabry-Perrot interferometer illuminated by an extended source.…”

Section: A Rough Surface Separating To Different Mediamentioning

confidence: 99%

Application of reduced Rayleigh equations to electromagnetic wave scattering by two-dimensional randomly rough surfaces

Soubret

Berginc²,

Bourrely

2001

Phys. Rev. B

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The small perturbations method has been extensively used for waves scattering by rough surfaces. The standard method developped by Rice is difficult to apply when we consider second and third order of scattered fields as a function of the surface height. Calculations can be greatly simplified with the use of reduced Rayleigh equations, because one of the unknown fields can be eliminated. We derive a new set of four reduced equations for the scattering amplitudes, which are applied to the cases of a rough conducting surface, and to a slab where one of the boundary is a rough surface. As in the one-dimensional case, numerical simulations show the appearance of enhanced backscattering for these structures.

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Section: A Rough Surface Separating To Different Mediamentioning

confidence: 99%

Application of reduced Rayleigh equations to electromagnetic wave scattering by two-dimensional randomly rough surfaces

Soubret

Berginc²,

Bourrely

2001

Phys. Rev. B

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“…29 The scattering of light from a one-dimensional randomly rough dielectric film deposited on a flat reflecting substrate has been studied. 30 ' 31 In particular, here we investigate the appearance of well-defined fringes in the angular distribution of the diffusely scattered intensity and their dependence on the angle of incidence, the roughness of the film, and the film's mean thickness. It was found that, for slightly rough films, the angle of incidence modulates the intensity of the fringes but has no effect on their angular position.…”

Section: Introductionmentioning

confidence: 99%

Grazing angle enhanced backscattering from a dielectric film on a reflecting metal substrate

Fuks

Ciftan

2004

Opt. Eng

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Public Reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Abstract. We have recently observed several features from a randomly rough dielectric film on a reflecting metal substrate including a change in the spectrum of light at the satellite peaks, the high-order correlation, and enhanced backscattering from the grazing angle. In this paper, we focus on the enhanced backscattering phenomena. The backscattering signal at small grazing angles is very important for vehicle re-entrance and subsurface radar sensing applications. Recently, we performed an experimental study of far-field scattering at small grazing angles, especially enhanced backscattering at grazing angles. For a randomly weak, rough dielectric film on a reflecting metal substrate, a much larger enhanced backscattering peak is measured. Experimental results are compared with theoretical predictions based on a two-scale surface roughness scattering model.

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“…For samples composed of a transparent layer on a reflecting substrate, these speckle patterns may be modulated by interference fringes [1,2]. The way the speckle pattern obtained in a given scattering configuration evolves with the system parameters, i.e.…”

mentioning

confidence: 99%

“…The contributions to these spatial correlations are divided into terms of short-range, C (1) and C (10) , long-range, C (1.5) and C (2) , and infinite-range correlation, C…”

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confidence: 99%

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Angular correlation properties of 2D‐nano‐roughness‐induced speckle patterns for silica‐on‐silicon wafers

Bony

Takakura²,

Satzke

et al. 2003

phys. stat. sol. (c)

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Experimental observation of angular speckle correlations for two-dimensional nano-rough silica layers on silicon substrate are presented. The set-up makes use of a digital CCD camera to record the speckle patterns as a function of illumination and scattering angular conditions. C(1) correlations corresponding to the optical memory and time-reverse memory effects are reported for three different samples. C (10) correlation does not presently seem to be observable.

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Scattering of light from a rough dielectric film on a reflecting substrate: diffuse fringes

Cited by 20 publications

References 16 publications

Application of reduced Rayleigh equations to electromagnetic wave scattering by two-dimensional randomly rough surfaces

Application of reduced Rayleigh equations to electromagnetic wave scattering by two-dimensional randomly rough surfaces

Grazing angle enhanced backscattering from a dielectric film on a reflecting metal substrate

Angular correlation properties of 2D‐nano‐roughness‐induced speckle patterns for silica‐on‐silicon wafers

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