Angular correlation properties of 2D‐nano‐roughness‐induced speckle patterns for silica‐on‐silicon wafers

Abstract

Experimental observation of angular speckle correlations for two-dimensional nano-rough silica layers on silicon substrate are presented. The set-up makes use of a digital CCD camera to record the speckle patterns as a function of illumination and scattering angular conditions. C(1) correlations corresponding to the optical memory and time-reverse memory effects are reported for three different samples. C (10) correlation does not presently seem to be observable.