Scanning probe microscopy with inherent disturbance suppression

Sparks, Andrew W.; Manalis, Scott R.

doi:10.1063/1.1812377

Cited by 11 publications

(10 citation statements)

References 12 publications

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“…The striation pattern has been observed previously and found to be due to the resonant vibration of the piezo tube scanner (e.g. [20][21][22][23][24]). Therefore, the dominant factor that limits the response speed of the system at 0.1 s per frame was the resonance of the piezo tube [14].…”

Section: (B)supporting

confidence: 64%

Imaging stability in force-feedback high-speed atomic force microscopy

Kim

Boehm

2013

Ultramicroscopy

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We studied the stability of force-feedback high-speed atomic force microscopy (HSAFM) by imaging soft, hard, and biological sample surfaces at various applied forces. The HSAFM images showed sudden topographic variations of streaky fringes with a negative applied force when collected on a soft hydrocarbon film grown on a grating sample, whereas they showed stable topographic features with positive applied forces. The instability of HSAFM images with the negative applied force was explained by the transition between contact and noncontact regimes in the force-distance curve. When the grating surface was cleaned, and thus hydrophilic by removing the hydrocarbon film, enhanced imaging stability was observed at both positive and negative applied forces. The higher adhesive interaction between the tip and the surface explains the improved imaging stability. The effects of imaging rate on the imaging stability were tested on an even softer adhesive Escherichia coli biofilm deposited onto the grating structure. The biofilm and planktonic cell structures in HSAFM images were reproducible within the force deviation less than ~0.5 nN at the imaging rate up to 0.2 s per frame, suggesting that the force-feedback HSAFM was stable for various imaging speeds in imaging softer adhesive biological samples.

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Section: (B)supporting

confidence: 64%

Imaging stability in force-feedback high-speed atomic force microscopy

Kim

Boehm

2013

Ultramicroscopy

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“…The striation pattern has been observed previously and found to be due to the piezo tube approaching resonant vibration frequency (e.g. Ando et al, 2001;Ando et al, 2008a;Miyagi et al, 2008;Schitter et al, 2001;Sparks and Manalis, 2004).…”

Section: Resultsmentioning

confidence: 62%

Force-feedback high-speed atomic force microscope for studying large biological systems

Kim

Boehm

2012

Micron

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We designed and developed a high-speed atomic force microscope (HSAFM) utilizing a forcefeedback scheme for imaging large biological samples. The system collects three simultaneous images: a deflection image, a topographic image, and a force image. We demonstrated that this force-feedback HSAFM is capable of acquiring large topographic images of Escherichia coli biofilms at approximately one frame per second in air. We discuss how the self-actuating cantilever and the piezo tube follow those larger biological topographic features during the HSAFM imaging process.

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“…We recently introduced a new approach, referred to as inherent disturbance suppression, capable of addressing this problem [4]. It requires the use of a secondary sensor, mounted adjacent to the scanning probe, that measures the separation between the probe and the average sample height.…”

Section: Introductionmentioning

confidence: 99%

Atomic force microscopy with inherent disturbance suppression for nanostructure imaging

Sparks

Manalis

2006

Nanotechnology

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Scanning probe imaging is often limited by disturbances, or mechanical noise, from the environment that couple into the microscope. We demonstrate, on a modified commercial atomic force microscope, that adding an interferometer as a secondary sensor to measure the separation between the base of the cantilever and the sample during conventional feedback scanning can result in real-time images with inherently suppressed out-of-plane disturbances. The modified microscope has the ability to resolve nanometre-scale features in situations where out-of-plane disturbances are comparable to, or even several orders of magnitude greater than, the scale of the topography. We present images of DNA in air from this microscope in tapping mode without vibration isolation, and show improved clarity using the interferometer as the imaging signal. The inherent disturbance suppression approach is applicable to all scanning probe imaging techniques.

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Scanning probe microscopy with inherent disturbance suppression

Cited by 11 publications

References 12 publications

Imaging stability in force-feedback high-speed atomic force microscopy

Imaging stability in force-feedback high-speed atomic force microscopy

Force-feedback high-speed atomic force microscope for studying large biological systems

Atomic force microscopy with inherent disturbance suppression for nanostructure imaging

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