Scanning Probe Microscopy in US Department of Energy Nanoscale Science Research Centers: Status, Perspectives, and Opportunities

Kalinin, Sergei V.

doi:10.1002/adfm.201300891

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“…AP-XPS experiments were performed at Brookhaven National Laboratory at the National Synchrotron Light Source, beamline X1A1. 25 In brief, a differentially pumped hemispherical analyzer (Specs Phoibos 150 NAP) was positioned at 70°with respect to the incident X-ray beam and 20°to the surface normal. The sample was positioned 0.5 mm from the aperture to ensure that the local surface pressure was not affected by differential pumping.…”

Section: ■ Methods and Materialsmentioning

confidence: 99%