Scanning Probe Microscopy

Lillehei, Peter T.; Bottomley, Lawrence A.

doi:10.1021/a10000108

Cited by 48 publications

(37 citation statements)

References 118 publications

(106 reference statements)

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“…Scanning probe microscopies (SPMs) are a related group of technologies which can yield information on both the topography and the mechanical, electrochemical, electrostatic, or magnetic properties of a sample surface (99,145). In all SPM formats, samples are imaged by rastering a cantilever-mounted tip over the surface of the sample in the x-y plane.…”

Section: Scanning Probe Microscopiesmentioning

confidence: 99%

“…on May 11, 2018 by guest http://mmbr.asm.org/ (99,145). The SPM family of tools includes scanning tunneling microscopy, atomic force microscopy (AFM), scanning electrochemical microscopy (SECM), and magnetic force microscopy (99,145,254).…”

mentioning

confidence: 99%

“…The SPM family of tools includes scanning tunneling microscopy, atomic force microscopy (AFM), scanning electrochemical microscopy (SECM), and magnetic force microscopy (99,145,254). SPM technologies have found widespread use in materials science applications and are fast becoming recognized for their potential to characterize biological materials, including single living cells, as described in the sections below.…”

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confidence: 99%

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Single-Cell Microbiology: Tools, Technologies, and Applications

Brehm-Stecher

Johnson

2004

Microbiol Mol Biol Rev

447

316

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The field of microbiology has traditionally been concerned with and focused on studies at the population level. Information on how cells respond to their environment, interact with each other, or undergo complex processes such as cellular differentiation or gene expression has been obtained mostly by inference from population-level data. Individual microorganisms, even those in supposedly “clonal” populations, may differ widely from each other in terms of their genetic composition, physiology, biochemistry, or behavior. This genetic and phenotypic heterogeneity has important practical consequences for a number of human interests, including antibiotic or biocide resistance, the productivity and stability of industrial fermentations, the efficacy of food preservatives, and the potential of pathogens to cause disease. New appreciation of the importance of cellular heterogeneity, coupled with recent advances in technology, has driven the development of new tools and techniques for the study of individual microbial cells. Because observations made at the single-cell level are not subject to the “averaging” effects characteristic of bulk-phase, population-level methods, they offer the unique capacity to observe discrete microbiological phenomena unavailable using traditional approaches. As a result, scientists have been able to characterize microorganisms, their activities, and their interactions at unprecedented levels of detail

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Section: Scanning Probe Microscopiesmentioning

confidence: 99%

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confidence: 99%

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confidence: 99%

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Single-Cell Microbiology: Tools, Technologies, and Applications

Brehm-Stecher

Johnson

2004

Microbiol Mol Biol Rev

447

316

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“…[1][2][3][4][5][6][7][8][9][10][11] An important aspect in many AFM experiments is determining the optical lever sensitivity ͑sen-sitivity͒ which allows the bending of the cantilever to be translated into the vertical deflection ͑distance͒ units. Combining the sensitivity and the calibrated normal spring constant [12][13][14][15] of the AFM cantilever allows the forces applied to the sample to be calculated.…”

Section: Introductionmentioning

confidence: 99%

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

Tourek

Sundararajan

2010

Review of Scientific Instruments

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Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the tip location. A comparison is presented between sensitivity values obtained from the conventional tip contact method and those derived from the wire-based technique for a range of cantilevers in air. It was found that the difference between the calculated sensitivity from the wire-based technique and the sensitivity obtained conventionally was less than 12%. These measurements indicate the presented method offers a simple alternative approach to obtain optical lever sensitivity without compromising the tip shape. KeywordsTungsten, Atomic force microscopy, Atomic force microscopes, Point contacts, Calibration, Bending, Materials analysis, Optical microscopes, Nanomaterials, Nanotechnology DisciplinesMechanical Engineering | Nanoscience and Nanotechnology CommentsThe following article appeared in Review of Scientific Instruments 81 (2010) Force studies using atomic force microscopy generally require knowledge of the cantilever spring constants and the optical lever sensitivity. The traditional method of evaluating the optical lever sensitivity by pressing the tip against a hard surface can damage the tip, especially sharp ones. Here a method is shown to calculate the sensitivity without having to bring the tip into contact. Instead a sharpened tungsten wire is used to cause a point contact directly onto the cantilever and cause cantilever bending. Using beam theory, the sensitivity thus found can be converted to the equivalent sensitivity that would be obtained using the tip location. A comparison is presented between sensitivity values obtained from the conventional tip contact method and those derived from the wire-based technique for a range of cantilevers in air. It was found that the difference between the calculated sensitivity from the wire-based technique and the sensitivity obtained conventionally was less than 12%. These measurements indicate the presented method offers a simple alternative approach to obtain optical lever sensitivity without compromising the tip shape.

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“…But more details on dynamic processes of the morphological changes of the cell are needed. Atomic force microscopy (AFM) has been employed as a powerful tool for imaging a wide and variety of biological specimens with high resolution (Lillehei and Bottomley 2000;Zhang et al 2009). The major contribution of AFM to cell studies is its ability to study the dynamic processes of living cells in the physiological conditions with high resolution and in situ (Rotsch et al 1999).…”

Section: Introductionmentioning

confidence: 99%

Atomic force microscopy study on chlorpromazine‐induced morphological changes of living HeLa cells In Vitro

Zhang

2009

Scanning

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Chlorpromazine (CPZ)-induced morphological changes of living human cervical carcinoma cells were investigated by atomic force microscopy in near physiological condition. The results showed that the cell morphology changed visibly with time in the presence of CPZ (>21 microM). The cell membrane shrank gradually and detached finally from the substrate. After being treated with CPZ for 50 min, the cell volume increased by about 27.6% while its projective area (cell adhered to the substrate) decreased by about 12%. The mechanism was also discussed.

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Scanning Probe Microscopy

Cited by 48 publications

References 118 publications

Single-Cell Microbiology: Tools, Technologies, and Applications

Single-Cell Microbiology: Tools, Technologies, and Applications

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

Atomic force microscopy study on chlorpromazine‐induced morphological changes of living HeLa cells In Vitro

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