Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers

Hu, Jun; Xiao, Xudong; Salmerón, Miquel

doi:10.1063/1.114541

Cited by 230 publications

(193 citation statements)

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“…The description of non-metallic surfaces is more difficult because the simple boundary condition of constant potential is not valid anymore and no simple analytical expressions can be derived to describe the interaction between insulating tips and samples [230,231]. Two cases have attracted special attention: The interaction between metallic tips and semiconductors [232,233] and the interaction between two metals, one being covered with an insulating layer [234]. The latter case is important for polarization force microscopy [234].…”

Section: Electrostatic Forcementioning

confidence: 99%

“…Two cases have attracted special attention: The interaction between metallic tips and semiconductors [232,233] and the interaction between two metals, one being covered with an insulating layer [234]. The latter case is important for polarization force microscopy [234]. It turns out that the main effect of an insulating layer on a metal is to reduce the electric field in the gap between tip and sample and thus reduce the electrostatic force [235].…”

Section: Electrostatic Forcementioning

confidence: 99%

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Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,135

2,907

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Section: Electrostatic Forcementioning

confidence: 99%

Section: Electrostatic Forcementioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,135

2,907

View full text Add to dashboard Cite

“…The adhesion force-versus-humidity curves on silicon wafer surface is as a function of the humidity and noticed that there are three distinct force regimes (Fig.4.22) [42,[207][208][209]. First, at low humidity ( ) adhesion forces are almost constant.…”

Section: Meniscus Force On Hydrophilic Surfacesmentioning

confidence: 99%

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

et al. 2006

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To optimize the handling of fine powders in industrial applications, understanding the interaction forces between single powder particles is fundamental. The forces between colloidal particles dominate the behavior of a great variety of materials, including paints, paper, soil, and many industrial processes. With the invention of the atomic force microscope (AFM), the direct measurement of the interaction between single micron-sized particles became possible. The adhesional contact between a particle and a substrate is a parameter for analyzing pull-off force data generated by AFM. The aim of this study was to understand surface interactions between fine particles. I measured the adhesion forces between AFM tips or particles attached to AFM cantilevers and different solid samples. Smooth and homogeneous surfaces such as silicon wafer, mica, or highly oriented pyrolytic graphite (HOPG), and more rough and heterogeneous surfaces such as iron particles or patterns of TiO 2 nanoparticles on silicon wafer were used. First, I addressed to the wellknown issue that AFM adhesion experiment results show wide distributions of adhesion forces rather than a single value. My experimental results show that variations in adhesion forces comprise fast (i.e., from one force curves to the next) random fluctuations and slower fluctuations, which occur over tens or hundreds of consecutive measurements. Slow fluctuations are not likely to be the result of variations in external factors such as lateral position, temperature, humidity, and so forth because those were kept constant. Even if two solid bodies are brought into contact under precisely the same conditions (same place, load, direction, etc.) the result of such a measurement will often not be the same as for the previous contact. The measurement itself will induce structural changes in the contact region which can change the value for the next adhesion force measurement.In the second part I studied the influence of humidity on the adhesion of nanocontacts. Humidity was adjusted relatively fast to minimize tip wear during one experiment. For hydrophobic surfaces, no signification change of adhesion force with humidity was observed. Adhesion force-versus-humidity curves recorded with hydrophilic surfaces either showed a maximum or continuously increased. I demonstrate that the results can be interpreted with simple continuum theory of the meniscus force. The meniscus force is calculated based on a model that includes surface roughness and takes into account different AFM tip (or particle) shapes by a two-sphere-model.Experimental and theoretical results show that the precise contact geometry has a critical influence on the humidity dependence of the adhesion force.Changes of tip geometry on the sub-10-nm length scale can completely change adhesion force-versus-humidity curves. Our model can also explain the differences between earlier AFM studies, where different dependencies of the adhesion force on humidity were observed.Keywords: Atomic force microscopy (AFM), cantile...

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“…Among them, we can cite nanoscale capacitance microscopy [1][2][3], electrostatic force microscopy (EFM) [4][5][6][7][8][9][10], nanoscale impedance microscopy [11,12], scanning polarization force microscopy [13][14][15][16], scanning microwave microscopy (SMM) [17,18] and nanoscale non-linear dielectric microscopy [19]. These techniques have allowed measuring the electric permittivity with nanoscale spatial resolution on planar samples, such as thin oxides, polymer films and supported biomembranes [2][3][4]8,10], and on non-planar ones, such as, single carbon nanotubes, nanowires, nanoparticles, viruses and bacterial cells [20][21][22][23][24][25][26][27][28][29][30].…”

Section: Introductionmentioning

confidence: 99%

Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy

et al. 2016

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Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode. We introduce a method to quantify and subtract the topographic crosstalk from the lift-mode EFM images, and a 3D numerical approach that allows for extracting the local dielectric constant with nanoscale spatial resolution free from topographic artifacts. We demonstrate this procedure by measuring the dielectric properties of micropatterned SiO 2 pillars and of single bacteria cells, thus illustrating the wide applicability of our approach from materials science to biology.

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Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers

Cited by 230 publications

References 1 publication

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

On the Adhesion between Fine Particles and Nanocontacts: An Atomic Force Microscope Study

Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy

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