Scanning near-field millimeter-wave microscopy using a metal slit as a scanning probe

Nozokido, Tatsuo; Bae, Jongsuck; Mizuno, Koji

doi:10.1109/22.910553

Cited by 53 publications

(31 citation statements)

References 17 publications

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“…Normal and tangential electric-field components [see Fig. 8(c)] were obtained using (3). As expected, the tangential component vanishes at the very center of the microstrip where the vector of electric intensity is perpendicular to the sample surface.…”

Section: Acquisition Of Tangential Components Of the Electric Fieldmentioning

confidence: 66%

“…In some cases, a modification in the probe geometry, such as the use of slit probes [3], [4], small dipole antennas, and open-ended transmission lines [5], [6] can increase signal-matching effi- ciency, change the polarization, or limit the region to which the antenna is sensitive. Due to good sensitivity and well-defined electric properties, we have focused our attention on the miniaturized coaxial antennas-cylindrical short monopoles-where a central conductor protrudes for a defined length from the shielding (see Fig.…”

Section: Electric-field Antennas and Position/signal Difference Mmentioning

confidence: 99%

“…Although its precise value has to be determined by numerical calculations [12], [13], we can estimate it by using an approximation of Hallén's equations for thin short wire antennas . For our short antennas (0.3-1 mm) and frequencies of interest (1)(2)(3)(4)(5), the impedance has a nearly pure capacitive character ( ) with values in the range of 10 -10 . The protruding conductor functions as a nearly ideal current source and it is difficult to match its high impedance to the subsequent preamplifier with a standard impedance of approximately .…”

Section: Sensitivity Of the System And Calibration Of The Probesmentioning

confidence: 99%

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Measurement of electric-field intensities using scanning near-field microwave microscopy

Kantor

Shvets

2003

IEEE Trans. Microwave Theory Techn.

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Abstract-In this paper, we propose methods for the measurement of electric intensities of a microwave field above the surface of microwave circuits. Using miniaturized coaxial antennas, we measure all spatial components of the induced field above device-under-test. A special position/signal difference method is used to better localize the measured field and increase the spatial resolution of the field mapping. During the scanning process, the antenna is driven at the defined distance above the sample surface according to previously acquired topographic data. For measurement of the tangential-field components parallel to the sample surface, the antenna is tilted by approximately 45 relative to the sample surface. By its rotation about the vertical axis, various components of the field are measured, and vertical and horizontal electric-field intensities are recalculated. The probes are calibrated in a well-defined field standard and allow good quantitative characterization of the measured field.Index Terms-Coaxial antennas, near-field measurements, scanning near-field microscopy.

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Section: Acquisition Of Tangential Components Of the Electric Fieldmentioning

confidence: 66%

Section: Electric-field Antennas and Position/signal Difference Mmentioning

confidence: 99%

Section: Sensitivity Of the System And Calibration Of The Probesmentioning

confidence: 99%

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Measurement of electric-field intensities using scanning near-field microwave microscopy

Kantor

Shvets

2003

IEEE Trans. Microwave Theory Techn.

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“…Other waveguide structure microscopes based on a scanned aperture were developed by Golosovsky et al [31,32] and Bae et al [33][34][35].…”

Section: Survey On Near-field Imaging From Microwave To Terahertz Frementioning

confidence: 99%

Review on Microwave Metamaterial Structures for Near‐Field Imaging

Matbouly¹

2017

Microwave Systems and Applications

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In the past decade, metamaterials have attracted a lot of attention because of their abilities to exhibit unusual electromagnetic properties. These properties are exploited in designing functional components and devices for many potential applications. In this chapter, we review the theory and design of metamaterial structures for microwave near-field imaging/microscopy. The chapter highlights metamaterial microwave components to obtain super-resolution and manipulating subwavelength images. Moreover, a review on surface plasmons manipulation at microwave frequencies is presented as a technique to enhance the transmission for near-field microscopy. The chapter presents as well a survey on the near-field imaging instrumentation and its advances mainly for microwave and THz regimes.

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“…Sheen et al demonstrated the detection of concealed items in a gypsum wall with a sophisticated image reconstruction algorithm in near-field region [2], Nozokido et al observed the evolution of photo-excited free-career distribution using a metal slit probe [11], and we has developed a concrete crack detection scanner, which is described in next section.…”

Section: Practical Issues Of Mmw Imagingmentioning

confidence: 99%