Scanning force and friction microscopy

Colchero, J.; Bielefeldt, H.; Ruf, Andreas; Hipp, M.; Marti, Othmar; Mlynek, J.

doi:10.1002/pssa.2211310112

Cited by 42 publications

(13 citation statements)

References 2 publications

(1 reference statement)

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…[6][7][8][9][10] It was also suggested that lateral forces could be used to extract information about the chemical composition of the sample. 11 Pioneering applications have included studies on phase separated and mixed organic films and patterned self-assembled monolayers. [12][13][14] Here we attempt to apply lateral force measurements as a tool to perform chemical maps of semiconductor surfaces.…”

Section: ͓S0003-6951͑96͒00516-9͔mentioning

confidence: 99%

Compositional mapping of semiconductor structures by friction force microscopy

Tamayo¹,

González²,

González³

et al. 1996

Applied Physics Letters

View full text Add to dashboard Cite

Topographic and chemical mapping of materials at high resolution define the goals of a microscope. Force microscopy can provide methods for simultaneous topography and chemical characterization of materials. Here we describe the use of the atomic force microscope to map chemical variations of semiconductor samples. Chemical maps of semiconductor InP/InGaAs alloys have been determined with 3 nm spatial resolution while 10% changes in indium composition are resolved in InxGa1−xAs structures. The present resolution is limited by the tip’s curvature radius, cantilever lateral force constant, and the total applied force. Theoretical calculations predict lateral compositional resolutions of about 1 nm.

show abstract

Section: ͓S0003-6951͑96͒00516-9͔mentioning

confidence: 99%

Compositional mapping of semiconductor structures by friction force microscopy

Tamayo¹,

González²,

González³

et al. 1996

Applied Physics Letters

View full text Add to dashboard Cite

show abstract

“…Sliding friction was measured versus load with individual microasperities, namely, with spherical silica particles of R = 2.5-µm radius. Friction at individual nanocontacts has already been investigated with the atomic force microscope (AFM) (4)(5)(6)(7)(8)(9)(10)(11)(12). In AFM experiments the typical radius of curvature of the asperity is 10-50 nm, leading to contact areas of typically few nanometers in diameter.…”

mentioning

confidence: 99%

Friction between Individual Microcontacts

Ecke

Butt

2001

Journal of Colloid and Interface Science

View full text Add to dashboard Cite

“…Changes in the friction coefficient and/or the attractive forces lead to different friction contrast, the so-called ''chemical sensitivity.'' 9 The frictional force dependence on the scan direction, leading to a typical contrast reversal, has been observed. 7 Thus, this method should be ideal to reveal different composition of materials at surfaces.…”

mentioning

confidence: 86%