Scanning electron microscopy of the normal epidermis and the epidermis in vitro

Abstract

SUMMARY A simplified technique has been used to examine the epidermis in five skin biopsies and in eight cultured skin specimens by scanning electron microscopy. Paraffin or cryostat sections of the tissue were cut and prepared according to routine histological methods and then given an electrically conducting coating before examination in the scanning electron microscope. The epidermis was easily identified and a particularly good view was obtained of intercellular bridges at high magnifications. Intra‐epidermal and basal layer dendritic cells were also easily located and their relationships to surrounding keratinocytes by long intercellular processes are described. The scanning electron microscopic appearance of epidermal cells in cultured explains of skin showed a strong resemblance to other cells and tissues in culture and also demonstrated the presence of a unicellular or subcellular membrane at the leading edge similar in appearance to the undulating membrane of fibroblasts in culture. It is stressed that the method is of particular use in the examination of intercellular relationships within the epidermis and in the inspection of histological material at higher magnifications than are possible by light microscopy.